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  • Engineering  (30)
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  • 1
    UID:
    b3kat_BV036650570
    Format: 1 Online-Ressource
    Edition: Online_Ausgabe Berlin [u.a.] Springer 2005 Springer ebook collection / Chemistry and Materials Science 2005-2008 Sonstige Standardnummer des Gesamttitels: 041171-1
    ISBN: 9783540265238
    Series Statement: Springer Series in Materials Science 81
    Additional Edition: Reproduktion von Pomogajlo, Anatolij D. Metallopolymer Nanocomposites 2005
    Additional Edition: Erscheint auch als Druckausgabe ISBN 978-3-540-20949-2
    Language: English
    Subjects: Engineering , Chemistry/Pharmacy , Physics
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    Keywords: Polymere ; Trägersubstanz ; Metallteilchen ; Nanopartikel ; Nanokomposit ; Aufsatzsammlung ; Aufsatzsammlung
    URL: Cover
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  • 2
    UID:
    b3kat_BV036650511
    Format: 1 Online-Ressource , v.: digital
    Edition: Online_Ausgabe Dordrecht Springer Science+Business Media B.V 2008 Springer ebook collection / Chemistry and Materials Science 2005-2008 Sonstige Standardnummer des Gesamttitels: 041171-1
    ISBN: 9781402068225 , 9781402068232
    Series Statement: NATO Science for Peace and Security Series
    Additional Edition: Reproduktion von Engineering of Crystalline Materials Properties 2008
    Language: English
    Subjects: Engineering
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    URL: Cover
    Author information: Braga, Dario
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  • 3
    UID:
    b3kat_BV035277060
    Format: 1 Online-Ressource (XII, 357 S. , graph. Darst.)
    ISBN: 3540606475
    Series Statement: Lecture notes in computer science 1018
    Language: English
    Subjects: Computer Science , Engineering
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    Keywords: Multimedia ; Rechnernetz ; Betriebssystem ; Konferenzschrift ; Konferenzschrift
    URL: Volltext  (lizenzpflichtig)
    URL: Volltext  (lizenzpflichtig)
    URL: Volltext  (lizenzpflichtig)
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  • 4
    UID:
    b3kat_BV036650648
    Format: 1 Online-Ressource
    Edition: Online-Ausgabe Springer ebook collection / Chemistry and Materials Science 2005-2008 Sonstige Standardnummer des Gesamttitels: 041171-1
    ISBN: 9783540294993
    Series Statement: Springer Series in Advanced Microelectronics 19
    Additional Edition: Reproduktion von Perevoščikov, Viktor A. Gettering Defects in Semiconductors 2005
    Additional Edition: Erscheint auch als Druckausgabe ISBN 978-3-540-26244-2
    Language: English
    Subjects: Engineering , Physics
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    Keywords: Halbleiter ; Störstelle ; Getterung
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  • 5
    UID:
    b3kat_BV012102571
    Format: XVI, 666 S. , graph. Darst.
    ISBN: 354063178X
    Note: Aus dem Chines. übers.
    Additional Edition: Erscheint auch als Online-Ausgabe ISBN 978-3-662-03553-5
    Language: English
    Subjects: Engineering , Physics
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    Keywords: Elektromagnetismus ; Theorie ; Optoelektronik ; Elektromagnetismus ; Theorie ; Mikrowelle ; Elektrodynamik ; Mikrowelle ; Lichtwelle
    URL: Cover
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  • 6
    Online Resource
    Online Resource
    Berlin [u.a.] : Springer
    UID:
    b3kat_BV022549281
    Format: 1 Online-Ressource
    ISBN: 9783540296577 , 9783540296584
    Additional Edition: Erscheint auch als Druck-Ausgabe, Paperback ISBN 3-540-29657-3
    Language: English
    Subjects: Engineering , Economics
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    Keywords: Logistik ; Innerbetrieblicher Transport ; Prozessmanagement ; Logistik ; Unternehmen ; Prozessmanagement ; Aufsatzsammlung
    Author information: Arnold, Dieter 1939-
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  • 7
    Online Resource
    Online Resource
    Berlin u.a. : Springer
    UID:
    b3kat_BV035850612
    Format: 1 Online-Ressource (IX, 124 S.)
    ISBN: 3540185402 , 0387185402
    Series Statement: Lecture notes in computer science 285
    Language: English
    Subjects: Computer Science , Engineering
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    Keywords: Digitalschaltung ; Semantik ; Programmiersprache ; Semantik ; Formale Semantik ; Programmiersprache ; Digitalschaltung
    URL: Volltext  (lizenzpflichtig)
    URL: Volltext  (lizenzpflichtig)
    URL: Volltext  (lizenzpflichtig)
    URL: Cover
    URL: Cover
    Author information: Delgado Kloos, Carlos
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  • 8
    UID:
    b3kat_BV014817945
    Format: XIII, 289 S. , Ill., graph. Darst.
    ISBN: 185233665X
    Series Statement: Engineering materials and processes
    Language: English
    Subjects: Engineering , Physics
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    Keywords: Verbundwerkstoff
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  • 9
    UID:
    b3kat_BV048323525
    Format: 1 Online-Ressource (282 Seiten)
    ISBN: 9783030617097
    Series Statement: Microsystems and Nanosystems Ser
    Note: Intro -- Foreword -- Preface -- Acknowledgements -- Abbreviations -- Contents -- About the Authors -- Part I: Context and Overview -- Chapter 1: The Opportunities and Challenges of MEMS Product Development -- Why Are MEMS So Challenging? -- Three-Dimensional Features Impede Process Flow Standardization -- Complex Processes and Microscale Physics Impair Precise Simulation -- MEMS Foundries Must Qualify each New Process Flow -- Planning for Successful MEMS Product Development -- Summary -- References -- Chapter 2: Economics of Semiconductor Device Manufacturing and Impacts on MEMS Product Development -- Economics of Silicon Wafer Manufacturing -- Parallel Fabrication Enables Economy of Scale -- Large Product Volumes Defray the Huge Capital Cost of Wafer Fabs -- Captive Fabs, Foundries, and the Fabless Model -- How MEMS Production Differs from Semiconductor Production -- MEMS Devices Are Physically Different from Electronic Semiconductor Devices -- MEMS Lack Standard Processes -- MEMS Products Have Lower Wafer Volumes per Process -- Summary -- References -- Chapter 3: Stages of MEMS Product Development -- The Five Stages to Commercialize a MEMS Product -- Proof-of-Concept Prototype -- Advanced Prototypes -- Foundry Feasibility -- Foundry Pilot Production Stage -- Foundry Production -- Funding and Schedule for the Five Stages -- Typical Budget and Timeline for Stages of Development -- Secure Continuous Funding for Efficient Product Development -- Summary -- References -- Part II: Business Requirements for a Viable Product -- Chapter 4: What Is the Product? Requirements Analysis -- Understanding the Market -- Market Perspective Frames Product Requirements Analysis -- Technology Push -- Market Pull -- Which Parties Dictate the Product Requirements? -- Understanding Technical Requirements -- Functional Requirements -- Environmental Requirements , Interface and Package Requirements -- Calibration Requirements -- Quality and Regulatory Requirements -- Understanding Business Requirements -- Unit Price Requirements -- Overcoming Existing Barriers to Entry -- Satisfying Intermediary Integrators -- Arranging Security of Supply -- Summary -- References -- Chapter 5: Is There a Business Opportunity? Product Unit Cost Modeling -- Rough Order of Magnitude Unit Cost -- Step 1: Calculate Number of Wafers Needed to Fabricate the Number of Units to be Sold in a Year -- Step 2: Calculate ROM MEMS Die Unit Cost -- Gain Insights from Parameter Sensitivity Analyses -- Detailed Unit Cost Model -- Step 1: Identify all Operations or Components of the Finished MEMS Product and Expected Yield for each -- Step 2: Gather Cost Data for each Manufacturing Operation -- Step 3: Assemble Model and Perform Parameter Sensitivity Analyses -- Track your Assumptions and Iterate the Model when Assumptions Change -- Advanced Unit Cost Modeling -- Beware of Common Blunders -- Summary -- References -- Chapter 6: What Is the Budget for Development? -- Understanding the Development Plan Cost Model Assumptions and Limitations -- Building a Level-of-Effort Cost Estimate -- Reducing Development Timelines -- Planning Staged Development and Go/No-Go Gates to Control Budget -- Go/No-Go Criteria for Moving to the Next Stage of Development -- Know your Company's Culture and Position to Inform your Development Plan -- Recouping Development Costs when Things Do Not Work out as Expected -- Summary -- References -- Chapter 7: Leveraging Third-Party Intellectual Property to Accelerate Product Development -- Academic Institutions or Universities -- Research Laboratories or Institutes -- Other Commercial Companies, Including Foundries -- Public Domain Knowledge -- Components for Purchase or "White-Label" Technology -- Summary -- References , Chapter 8: Organization Planning for Successful Development -- Proof-of-Concept Stage: Start-Up Company or R& -- D Group within an Established Company -- Advanced Prototypes Stage: Start-Up Company or an Established Company Licensing MEMS Technology -- Foundry Development Stages: Start-up or Established Company -- Product Integration: Start-up or Established Company That Purchases Third-Party MEMS Components for Its MEMS-Enabled Product -- External Team Members -- Outsourcing to Vendors -- Vendor and Supply Chain Management -- Summary -- References -- Part III: Technical Requirements for a Viable Product -- Chapter 9: The MEMS Product: Functional Partitioning and Integration -- A MEMS Product Is a System -- Package -- Environmental Protection -- Electrical Connection -- Interaction with Phenomena -- Electrical Isolation -- Mechanical Isolation or Damping -- Other Functions -- Electronics -- Power -- Readout and Signal Processing -- Control -- Software -- Levels of Integration -- Board-Level Integration -- Package-Level Integration -- Known Good Die and Multichip Packages -- Die-Level Integration -- Trade-Offs to Consider in Integration -- A Common MEMS Product Embodiment -- Summary -- References -- Chapter 10: Starting a New MEMS Device Design -- Overview of New Product Design -- Explore the Design Space Using Analytical Models -- Using Design Space Plots -- Mind the Practical Limits of Analytical Models -- Building Useful and Meaningful Computational Models -- Build a Simple Model First and Validate It -- Incorporating Input from Other System Components -- Example of the Benefits of Simulation: Understanding Environment Impact on Device Performance -- Managing Uncertainty in Models -- Sources of Uncertainty in Modeling -- Parameter Sensitivity Analysis -- Example: Managing Boundary Condition and Material Property Uncertainties , Use Measured Data to Improve Model Accuracy -- When Testing and Measurement are More Efficient or Useful than Simulation -- Business Factors in MEMS Design -- Leverage Simulation to Reduce the Cost, Risk, and Time of Product Development -- Summary -- References -- Chapter 11: Design for Manufacturing: Process Integration and Photomask Layout -- Assembling a MEMS Process Flow -- Common MEMS Process Modules -- Designing for Realistic Fabrication Conditions in Volume Production -- Using "Secret Sauce" Processes -- Creating a Process Flow Runsheet -- Leveraging Foundry Process Platforms -- Best Practices for Lithography and Photomask Layout -- Lithography Methods and Parameters -- Photoresist -- Alignment Strategy and Marks -- Setting up the Photomask Layout File -- Design Variants -- Testing, Packaging, and Assembly Layout Considerations -- Planning for Future Die Shrink -- Finalizing a Mask Layout -- Summary -- References -- Chapter 12: Design for Back-end-of-Line Processes -- Wafer Sort -- Wafer Thinning -- Singulation -- Package and Assembly -- Summary -- References -- Chapter 13: Strategies for Codevelopment of the Electronics and Package -- Codevelopment Challenges -- Using Proxies to Enable Parallel Development -- Electronics Development Proxies -- Leveraging Sensor Signal Conditioning (SSC) Chips and Microcontrollers -- System-Side Electronics Interfaces -- Packaging Development Proxies -- Examples of Codevelopment with Proxies -- Summary -- References -- Chapter 14: Planning a Development Test Program -- Understanding Test Types: Development Test vs. Manufacturing Test -- Development Test -- How Testing, Performance, Reliability, Product Qualification, and Failure Analysis Are Related -- Establishing Test Requirements -- Standard Tests can Leverage Existing Equipment and Expertise -- The Role of In-Field Testing in Defining Qualification Tests , Establishing Test Capability -- Characterization Test is a Core Capability -- Developing Characterization Test Capability -- Information Quality vs. Test Speed and Volume -- Testing During vs. Before and After Exposure to Conditions -- Developing for In-Field Test Capability -- Best Practices for Enabling Failure Analysis -- Localize the Problem -- Observation Modes -- Using Test Structures -- Summary -- References -- Chapter 15: Risk Mitigation Strategies for Prototype Fabrication -- Knowing Your Organization's Tolerance for Risk -- Analyze Process Risks and Explore Trade-Offs -- Process Development Risk Mitigation Strategies -- Short loop Process Experiments -- Staging, Split Lots, and Look-Ahead Wafers -- Parallel Lot Processing -- Cost-Effective Planning -- After Spending the Money and Time, Be Sure to Harvest the Data -- Example: Using Fabrication Risk Mitigation Strategies -- Process Risk Mitigation in a Production Fab -- Summary -- References -- Chapter 16: Documenting MEMS Product Technology for Transfer to Manufacturing -- What Needs to Be Documented and Why -- Milestone Design Reviews -- System Functional Diagrams and Schematics -- Simulation Models and Results -- Documentation for MEMS Foundry Transfer -- Photomask Layout Data -- Photomask Layout File -- Photomask Layer Definition -- High-Level Process Flow Summary -- Layout Design Specifications -- MEMS Process Flow -- Runsheet and Process Tolerances -- Inspection and Acceptance Criteria -- Documentation for Other Supply Chain Vendors -- Back End, Packaging, and Other Supply Chain Vendors -- Process Quality Control and Qualification Test Documents -- Summary -- References -- Part IV: Technology Transfer and Scaling Up Manufacturing -- Chapter 17: Determining Readiness for Volume Production -- Understanding Development Versus Production Environments -- Staff Composition and Mindset , Job queuing and Process Stability
    Additional Edition: Erscheint auch als Druck-Ausgabe Fitzgerald, Alissa M. MEMS Product Development Cham : Springer International Publishing AG,c2021 ISBN 9783030617080
    Language: English
    Subjects: Engineering
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    URL: Volltext  (URL des Erstveröffentlichers)
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  • 10
    UID:
    b3kat_BV019774690
    Format: XXIV, 967 S. , Ill., graph. Darst. , 24 cm
    Edition: 3. ed., internat. ed.
    ISBN: 0321149017 , 0321269772
    Note: Revision of: Principles of CMOS VLSI design. 1993. , Includes bibliographical references (p. 927-952) and index
    Language: English
    Subjects: Computer Science , Engineering
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    Keywords: CMOS-Schaltung ; VLSI
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