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  • American Vacuum Society  (1)
  • Koutouzov, S.  (1)
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  • American Vacuum Society  (1)
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    Online Resource
    Online Resource
    American Vacuum Society ; 2006
    In:  Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena Vol. 24, No. 3 ( 2006-05-01), p. 1156-1161
    In: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, American Vacuum Society, Vol. 24, No. 3 ( 2006-05-01), p. 1156-1161
    Abstract: Spherical Si and SnOx nanoparticles in the size range between 3 and 30nm have been synthesized by microwave induced decomposition of silane and gas phase condensation, respectively. They are deposited on thin metal films and investigated by electron microscopy, Auger electron, and electron energy loss spectroscopy. An analysis of the surface composition and stoichiometry reveals that the Si particles are covered with a native oxide of less than 1nm. The energy loss spectra show features corresponding to electronic excitations in the nanoparticles due to valence band plasmons, interband transitions, and core-level ionizations. The plasmon energies are found to increase with decreasing particle diameter d as d−1.17 for Si and d−0.83 for SnOx. These energy shifts are related to the change of the dielectric band gap energy of the semiconductor due to quantum size effects.
    Type of Medium: Online Resource
    ISSN: 1071-1023 , 1520-8567
    RVK:
    Language: English
    Publisher: American Vacuum Society
    Publication Date: 2006
    detail.hit.zdb_id: 3117331-7
    detail.hit.zdb_id: 3117333-0
    detail.hit.zdb_id: 1475429-0
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