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  • 2020-2024
  • 2000-2004
  • 1995-1999  (217)
  • 1999  (217)
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  • 2020-2024
  • 2000-2004
  • 1995-1999  (217)
  • 1980-1984  (1)
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  • 1
    Buch
    Buch
    Boston ; Basel ; Berlin :Birkhäuser,
    UID:
    almahu_BV012349538
    Umfang: 249 S.
    ISBN: 3-7643-6058-5 , 0-8176-6058-5
    Serie: Trends in mathematics
    Sprache: Deutsch
    Fachgebiete: Mathematik
    RVK:
    Schlagwort(e): Algebra ; Aufsatzsammlung ; Aufsatzsammlung ; Aufsatzsammlung ; Aufsatzsammlung ; Aufsatzsammlung
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 2
    UID:
    almafu_BV012755461
    Umfang: 341 S. : graph. Darst.
    Ausgabe: 1. publ.
    ISBN: 81-7036-809-X , 0-7619-9344-4
    Sprache: Englisch
    Fachgebiete: Politologie
    RVK:
    RVK:
    Schlagwort(e): Wahl ; Sozialer Wandel
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 3
    Buch
    Buch
    Delhi, India :Bharatiya Kala Prakashan,
    UID:
    almafu_BV013741188
    Umfang: XIV, 192, XXXVII S. : , Ill., Kt.
    Ausgabe: 1. ed.
    ISBN: 81-86050-34-5
    Sprache: Englisch
    Schlagwort(e): Familie 1000-1526 Kakatiya ; Kunst ; Familie 1000-1526 Kakatiya ; Architektur
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 4
    Buch
    Buch
    New Delhi [u.a.] :Oxford Univ. Press,
    UID:
    almahu_BV013778107
    Umfang: XIV, 114 S. : Ill., Kt.
    Ausgabe: 1. publ.
    ISBN: 0-19-564919-2
    Inhalt: Covers ancient, medieval, and modern periods.
    Sprache: Englisch
    Fachgebiete: Geschichte
    RVK:
    Schlagwort(e): Geschichte ; Altertümer
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 5
    Buch
    Buch
    Chicago ; London :The University of Chicago Press,
    UID:
    almafu_BV012912182
    Umfang: XII, 237 Seiten.
    ISBN: 0-226-51881-7 , 0-226-51882-5 , 978-0-226-51882-4
    Anmerkung: Hier auch später erschienene, unveränderte Nachdrucke
    Sprache: Englisch
    Fachgebiete: Politologie , Anglistik
    RVK:
    RVK:
    Schlagwort(e): Imperialismus ; Liberalismus
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 6
    UID:
    almafu_BV012300014
    Umfang: XIV, 468 S. : Ill., graph. Darst.
    ISBN: 1-85233-078-3
    Anmerkung: Literaturangaben
    Sprache: Deutsch
    Fachgebiete: Informatik
    RVK:
    Schlagwort(e): Bildverarbeitung ; Mustererkennung ; Konferenzschrift ; Kongress ; Konferenzschrift ; Konferenzschrift
    Mehr zum Autor: Singh, Sameer 1970-
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 7
    Online-Ressource
    Online-Ressource
    San Diego :Academic Press,
    UID:
    almahu_9948026138602882
    Umfang: 1 online resource (591 p.)
    ISBN: 1-283-17380-8 , 9786613173805 , 0-08-053353-1
    Serie: Handbook of low and high dielectric constant materials and their applications ; v. 2
    Inhalt: Recent developments in microelectronics technologies have created a great demand for interlayer dielectric materials with a very low dielectric constant. They will play a crucial role in the future generation of IC devices (VLSI/UISI and high speed IC packaging). Considerable efforts have been made to develop new low as well as high dielectric constant materials for applications in electronics industries. Besides achieving either low or high dielectric constants, other materials' properties such as good processability, high mechanical strength, high thermal and environmental stability, low the
    Anmerkung: Description based upon print version of record. , Front Cover; Handbook of Low and High Dielectric Constant Materials and Their Applications; Copyright Page; Contents; Preface; About the Editor; List of Contributors; Chapter 1. LOW DIELECTRIC CONSTANT MATERIALS FOR INTERLAYER DIELECTRICS; 1. The Need for Low Dielectric Constant (Low-er) Interlayer Dielectrics; 2. Current Status of the Technology; 3. Low-er Materials; 4. Deposition of Polymer Thin Films; 5. Electrical Characterization of Dielectric Materials; 6. Summary; Acknowledgments; References , Chapter 2. LOW DIELECTRIC CONSTANT GLASSES AND GLASS-CERAMICS FOR ELECTRONIC PACKAGING APPLICATIONS1. Introduction; 2. Substrate Materials for Electronic Packaging; 3. Fundamental Concepts of Low-Dielectric-Constant Dielectric Materials; 4. Low-Dielectric-Constant Glass and Glass-Ceramic Systems; 5. Chemical Processing of Glasses and Nonoxide Ceramics; 6. Oxynitride Glasses; 7. Modified Oxide Sol-Gel Approaches to Synthesize Borophosphosilicate Glasses and Glass-Ceramics; 8. Development of Borophosphosilicate Glasses and Glass-Ceramics , 9. Incorporation of Nitrogen and Its Influence on the Structure and Dielectric Properties of Borosilicate Glasses10. Conclusions; 11. Summary and Prospects; Acknowledgements; References; Chapter 3. LOW-k AMORPHOUS CARBON FILMS FOR INTERCONNECTS OF SUBMICRON-SCALE DEVICES; 1. Deposition of Amorphous Carbon Thin Films; 2. Integration of Fluorinated Amorphous Carbon; 3. Summary; Acknowledgments; References; Chapter 4. CYANATE ESTER RESINS WITH LOW DIELECTRIC PROPERTIES AND APPLICATIONS; 1. Introduction; 2. Historical Developments; 3. Cyanate Ester Resin Chemistry; 4. Dielectric Properties , 5. Applications6. Conclusion; Acknowledgments; References; Chapter 5. LOW DIELECTRIC CONSTANT EPOXY RESINS; 1. Introduction; 2. The Key Technology of Low Dielectric Constant Epoxy Resins; 3. Alkyl Phenol Novolac Epoxy Resins; 4. Dicyclopentadiene Epoxy Resins; 5. Active Ester Novolac Hardeners; 6. Conclusions; Acknowledgments; References; Chapter 6. CHEMICAL MECHANICAL POLISHING OF ORGANIC POLYMERIC MATERIALS FOR IC APPLICATIONS; 1. Introduction; 2. Historical Perspective on Polymer Chemical Mechanical Polishing; 3. Description of Dielectric Chemical Mechanical Polishing , 4. Fundamental Physical Mechanisms in Dielectric Chemical Mechanical Polishing5. Previous LOW-K Chemical Mechanical Polishing Work; 6. Chemical Mechanical Polishing of FLARE; 7. Chemical Mechanical Polishing Performance of ZrO2-Based Slurry on FLARE; 8. Surface Structure of Polished FLARE Films; 9. Summary; Acknowledgments; References; Chapter 7. DIELECTRIC SPECTROSCOPY OF CRYSTALLINE POLYMERS AND BLENDS; 1. Introduction; 2. Background; 3. Single-Component Systems; 4. Polymer Blends; 5. Conclusions; References; Chapter 8. METALLOPHTHALOCYANINES AS HIGH-DIELECTRIC CONSTANT MATERIALS , 1. Monomeric Phthalocyanines , English
    Weitere Ausg.: ISBN 0-12-513905-5
    Sprache: Englisch
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 8
    Online-Ressource
    Online-Ressource
    Amsterdam ; : Elsevier,
    UID:
    almahu_9948025739002882
    Umfang: 1 online resource (282 p.)
    Ausgabe: 1st ed.
    ISBN: 1-281-02685-9 , 9786611026851 , 0-08-054065-1
    Inhalt: Rock Mass Classifications - A Practical Approach in Civil Engineering was written in response to the many unanswered questions regarding this subject. Questions such as - Is Classification reasonably reliable? Can it be successful in crisis management of geohazards? Can a single Classification system be general for all rock structures? Is Classification a scientific approach? Laborious field research was undertaken in the Himalayan mountains by a team of scientists from the Central Mining Research Institute (CMRI), University of Roorkee (UOR), Central Soil and Material Research Station
    Anmerkung: Description based upon print version of record. , Front Cover; ROCK MASS CLASSIFICATION: A Practical Approach in Civil Engineering; Copyright Page; CONTENTS; PREFACE; CHAPTER 1. PHILOSOPHY OF QUANTITATIVE CLASSIFICATIONS; 1.1 The Classification; 1.2 Philosophy of Classification System; 1.3 Management of Uncertainties; 1.4 Present Day Practice; 1.5 Scope of the Book; CHAPTER 2. SHEAR ZONE TREATMENT IN TUNNELS AND FOUNDATIONS; 2.1 Shear Zone; 2.2 Treatment for Tunnels; 2.3 Treatment for Dam Foundations; CHAPTER 3. ROCK MATERIAL; 3.1 Rock Material; 3.2 Homogeneity and Inhomogeneity; 3.3 Classification of Rock Material; 3.4 Class l and II Rocks , 3.5 Uniaxial Compression3.6 Stability in Water; 3.7 Classification on the Basis of Slake Durability Index; CHAPTER 4. ROCK QUALITY DESIGNATION; 4.1 Rock Quality Designation (RQD); 4.2 Direct Method; 4.3 Indirect Methods; 4.4 Weighted Joint Density; CHAPTER 5. TERZAGHl'S ROCK LOAD THEORY; 5.1 Introduction; 5.2 Rock Classes; 5.3 Rock Load Factor; 5.4 Modified Terzaghi's Theory for Tunnels and Caverns; CHAPTER 6. ROCK MASS RATING (RMR); 6.1 Introduction; 6.2 Collection of Field Data; 6.3 Estimation of Rock Mass Rating (RMR); 6.4 Applications of RMR; 6.5 Inter-relation Between RMR and Q , 6.6 PrecautionsCHAPTER 7. PREDICTION OF GROUND CONDITIONS FOR TUNNELLING; 7.1 Introduction; 7.2 The Tunnelling Conditions; 7.3 Empirical Approach; 7.4 Theoretical / Analytical Approach; 7.5 Effect of Thickness of Weak Band on Squeezing Ground Condition; CHAPTER 8. ROCK MASS QUALITY (Q) - SYSTEM; 8.1 The Q-System; 8.2 The Joint Orientation and the Q-system; 8.3 Updating of the Q-system; 8.4 Collection of Field Data; 8.5 Classification of the Rock Mass; 8.6 Estimation of Support Pressure; 8.7 Unsupported Span; 8.8 Design of Supports; 8.9 New Austrian Tunnelling Method (NATM) , 8.10 Norwegian Method of Tunnelling (NMT)8.11 Other Applications of the Q - System; CHAPTER 9. ROCK MASS NUMBER; 9.1 Introduction; 9.2 Inter-relation Between Q and RMR; 9.3 Prediction of Ground Conditions; 9.4 Prediction of Support Pressure; 9.5 Effect of Tunnel Size on Support Pressure; 9.6 Correlations for Estimating Tunnel Closure; 9.7 Effect of Tunnel Depth on Support Pressure and Closure in Tunnels; 9.8 Approach for Obtaining Ground Reaction Curve (GRC); 9.9 Coefficient of Volumetric Expansion of Failed Rock Mass; CHAPTER 10. ROCK MASS INDEX; 10.1 Introduction , 10.2 Selection of Parameters used in RMi10.3 Calibration of RMi from Known Rock Mass Strength Data; 10.4 Scale Effect; 10.5 Examples (Palmstrom, 1995); 10.6 Applications of RMi; 10.7 Benefits of Using RMi; 10.8 Limitations of RMi; CHAPTER 11. RATE OF TUNNELLING; 11.1 Introduction; 11.2 Classification of Ground/Job Conditions for Rate of Tunnelling; 11.3 Classification of Management Conditions for Rate of Tunnelling; 11.4 Combined Effect of Ground and Management Conditions on Rate of Tunnelling; CHAPTER 12. SUPPORT SYSTEM IN CAVERNS; 12.1 Support Pressure; 12.2 Wall Support in Caverns , 12.3 Roof Support in Caverns , English
    Weitere Ausg.: ISBN 0-08-043013-9
    Sprache: Englisch
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  • 9
    Buch
    Buch
    Santa Barbara, Calif. [u.a.] : ABC-Clio
    UID:
    b3kat_BV023522017
    Umfang: XLIII, 377 S. , Ill.
    ISBN: 1576071340
    Sprache: Englisch
    Fachgebiete: Ethnologie
    RVK:
    Schlagwort(e): Enzyklopädie ; Wörterbuch
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 10
    UID:
    gbv_265270685
    Umfang: XXIV, 455 S , graph. Darst , 24 cm
    ISBN: 3540657134
    Serie: Lecture notes in computer science 1555
    Anmerkung: Literaturangaben
    Weitere Ausg.: ISBN 9783540490579
    Sprache: Englisch
    Schlagwort(e): Agent ; Konferenzschrift
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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