In:
Journal of Physics E: Scientific Instruments, IOP Publishing, Vol. 15, No. 11 ( 1982-11-01), p. 1140-1155
Abstract:
The fundamental theories of X-ray diffraction are outlined and the following experimental techniques are dealt with: X-ray diffraction topography; X-ray interferometry; and synchrotron radiation as an improved X-ray source.
Type of Medium:
Online Resource
ISSN:
0022-3735
DOI:
10.1088/0022-3735/15/11/002
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
1982
detail.hit.zdb_id:
2105243-8
detail.hit.zdb_id:
209222-0
detail.hit.zdb_id:
1362523-8
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