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  • TH Wildau  (25)
  • Jüdisches Museum  (15)
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  • 11
    UID:
    b3kat_BV036650386
    Format: 1 Online-Ressource
    Edition: Online-Ausgabe 2008 Springer ebook collection / Chemistry and Materials Science 2005-2008 Sonstige Standardnummer des Gesamttitels: 041171-1
    ISBN: 9780387494890
    Series Statement: Modern Aspects of Electrochemistry 42
    Additional Edition: Reproduktion von Modern Aspects of Electrochemistry No. 42 2008
    Additional Edition: Erscheint auch als Druckausgabe ISBN 978-0-387-49488-3
    Language: English
    Library Location Call Number Volume/Issue/Year Availability
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  • 12
    Online Resource
    Online Resource
    New York, NY [u.a.] : Kluwer Academic Publishers | New York, NY [u.a.] : Springer Science + Business Media
    UID:
    b3kat_BV036650283
    Format: 1 Online-Ressource
    Edition: Online-Ausgabe Springer ebook collection / Chemistry and Materials Science 2005-2008 Sonstige Standardnummer des Gesamttitels: 041171-1
    ISBN: 9780387258386
    Series Statement: Modern Aspects of Electrochemistry 38
    Additional Edition: Reproduktion von Modern Aspects of Electrochemistry No. 38 2005
    Additional Edition: Erscheint auch als Druckausgabe ISBN 978-0-306-48703-3
    Language: English
    Keywords: Elektrolyt ; Physikalische Chemie ; Ionenaustausch ; Elektrochemie ; Diffusion
    Library Location Call Number Volume/Issue/Year Availability
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  • 13
    Book
    Book
    Beijing [u.a.] : O'Reilly
    UID:
    b3kat_BV042591245
    Format: XXV, 727 S. , Ill, graph. Darst.
    Edition: 4. ed., [rev. & updated]
    ISBN: 9781491901632 , 1491901632
    Note: Auf dem Cover: "storage and analysis at internet scale"
    Language: English
    Subjects: Computer Science
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    Keywords: Verteiltes System ; Framework ; Big Data ; Open Source ; Dateiorganisation ; Cluster-Analyse ; Hadoop
    URL: Cover
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  • 14
    Online Resource
    Online Resource
    London : Palgrave Macmillan UK
    UID:
    b3kat_BV047942676
    Format: 1 Online-Ressource (XII, 265 Seiten)
    ISBN: 9780230624832
    Content: Incorporating an accurate measure of risk is important to the appraisal of an international investment. This book examines and recommends how decisions on international investment projects are made. Critiquing and integrating existing theory, it shows how risk can be incorporated into the present value formula produce a clear decision rule
    Additional Edition: Erscheint auch als Druck-Ausgabe ISBN 9781349523108
    Language: English
    URL: Volltext  (URL des Erstveröffentlichers)
    URL: Volltext  (Deutschlandweit zugänglich)
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  • 15
    UID:
    b3kat_BV040292213
    Format: XXIII, 657 S. , Ill., graph. Darst.
    Edition: 3. ed., [rev. & updated]
    ISBN: 9781449311520 , 1449311520
    Content: Contents: Meet Hadoop -- MapReduce -- The Hadoop distributed filesystem -- Hadoop I/O -- Developing a MapReduce application -- How MapReduce works -- MapReduce types and formats -- MapReduce features -- Setting up a Hadoop cluster -- Administering Hadoop -- Pig -- Hive -- HBase -- ZooKepper -- Sqoop -- Case studies -- Installing Apache Hadoop -- Cloudera's distribution including Apache Hadoop -- Preparing the NCDC weather data.
    Language: English
    Subjects: Computer Science
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    Keywords: Hadoop ; Verteiltes System ; Framework ; Big Data ; Open Source ; Dateiorganisation ; Cluster-Analyse
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  • 16
    UID:
    b3kat_BV048323525
    Format: 1 Online-Ressource (282 Seiten)
    ISBN: 9783030617097
    Series Statement: Microsystems and Nanosystems Ser
    Note: Intro -- Foreword -- Preface -- Acknowledgements -- Abbreviations -- Contents -- About the Authors -- Part I: Context and Overview -- Chapter 1: The Opportunities and Challenges of MEMS Product Development -- Why Are MEMS So Challenging? -- Three-Dimensional Features Impede Process Flow Standardization -- Complex Processes and Microscale Physics Impair Precise Simulation -- MEMS Foundries Must Qualify each New Process Flow -- Planning for Successful MEMS Product Development -- Summary -- References -- Chapter 2: Economics of Semiconductor Device Manufacturing and Impacts on MEMS Product Development -- Economics of Silicon Wafer Manufacturing -- Parallel Fabrication Enables Economy of Scale -- Large Product Volumes Defray the Huge Capital Cost of Wafer Fabs -- Captive Fabs, Foundries, and the Fabless Model -- How MEMS Production Differs from Semiconductor Production -- MEMS Devices Are Physically Different from Electronic Semiconductor Devices -- MEMS Lack Standard Processes -- MEMS Products Have Lower Wafer Volumes per Process -- Summary -- References -- Chapter 3: Stages of MEMS Product Development -- The Five Stages to Commercialize a MEMS Product -- Proof-of-Concept Prototype -- Advanced Prototypes -- Foundry Feasibility -- Foundry Pilot Production Stage -- Foundry Production -- Funding and Schedule for the Five Stages -- Typical Budget and Timeline for Stages of Development -- Secure Continuous Funding for Efficient Product Development -- Summary -- References -- Part II: Business Requirements for a Viable Product -- Chapter 4: What Is the Product? Requirements Analysis -- Understanding the Market -- Market Perspective Frames Product Requirements Analysis -- Technology Push -- Market Pull -- Which Parties Dictate the Product Requirements? -- Understanding Technical Requirements -- Functional Requirements -- Environmental Requirements , Interface and Package Requirements -- Calibration Requirements -- Quality and Regulatory Requirements -- Understanding Business Requirements -- Unit Price Requirements -- Overcoming Existing Barriers to Entry -- Satisfying Intermediary Integrators -- Arranging Security of Supply -- Summary -- References -- Chapter 5: Is There a Business Opportunity? Product Unit Cost Modeling -- Rough Order of Magnitude Unit Cost -- Step 1: Calculate Number of Wafers Needed to Fabricate the Number of Units to be Sold in a Year -- Step 2: Calculate ROM MEMS Die Unit Cost -- Gain Insights from Parameter Sensitivity Analyses -- Detailed Unit Cost Model -- Step 1: Identify all Operations or Components of the Finished MEMS Product and Expected Yield for each -- Step 2: Gather Cost Data for each Manufacturing Operation -- Step 3: Assemble Model and Perform Parameter Sensitivity Analyses -- Track your Assumptions and Iterate the Model when Assumptions Change -- Advanced Unit Cost Modeling -- Beware of Common Blunders -- Summary -- References -- Chapter 6: What Is the Budget for Development? -- Understanding the Development Plan Cost Model Assumptions and Limitations -- Building a Level-of-Effort Cost Estimate -- Reducing Development Timelines -- Planning Staged Development and Go/No-Go Gates to Control Budget -- Go/No-Go Criteria for Moving to the Next Stage of Development -- Know your Company's Culture and Position to Inform your Development Plan -- Recouping Development Costs when Things Do Not Work out as Expected -- Summary -- References -- Chapter 7: Leveraging Third-Party Intellectual Property to Accelerate Product Development -- Academic Institutions or Universities -- Research Laboratories or Institutes -- Other Commercial Companies, Including Foundries -- Public Domain Knowledge -- Components for Purchase or "White-Label" Technology -- Summary -- References , Chapter 8: Organization Planning for Successful Development -- Proof-of-Concept Stage: Start-Up Company or R& -- D Group within an Established Company -- Advanced Prototypes Stage: Start-Up Company or an Established Company Licensing MEMS Technology -- Foundry Development Stages: Start-up or Established Company -- Product Integration: Start-up or Established Company That Purchases Third-Party MEMS Components for Its MEMS-Enabled Product -- External Team Members -- Outsourcing to Vendors -- Vendor and Supply Chain Management -- Summary -- References -- Part III: Technical Requirements for a Viable Product -- Chapter 9: The MEMS Product: Functional Partitioning and Integration -- A MEMS Product Is a System -- Package -- Environmental Protection -- Electrical Connection -- Interaction with Phenomena -- Electrical Isolation -- Mechanical Isolation or Damping -- Other Functions -- Electronics -- Power -- Readout and Signal Processing -- Control -- Software -- Levels of Integration -- Board-Level Integration -- Package-Level Integration -- Known Good Die and Multichip Packages -- Die-Level Integration -- Trade-Offs to Consider in Integration -- A Common MEMS Product Embodiment -- Summary -- References -- Chapter 10: Starting a New MEMS Device Design -- Overview of New Product Design -- Explore the Design Space Using Analytical Models -- Using Design Space Plots -- Mind the Practical Limits of Analytical Models -- Building Useful and Meaningful Computational Models -- Build a Simple Model First and Validate It -- Incorporating Input from Other System Components -- Example of the Benefits of Simulation: Understanding Environment Impact on Device Performance -- Managing Uncertainty in Models -- Sources of Uncertainty in Modeling -- Parameter Sensitivity Analysis -- Example: Managing Boundary Condition and Material Property Uncertainties , Use Measured Data to Improve Model Accuracy -- When Testing and Measurement are More Efficient or Useful than Simulation -- Business Factors in MEMS Design -- Leverage Simulation to Reduce the Cost, Risk, and Time of Product Development -- Summary -- References -- Chapter 11: Design for Manufacturing: Process Integration and Photomask Layout -- Assembling a MEMS Process Flow -- Common MEMS Process Modules -- Designing for Realistic Fabrication Conditions in Volume Production -- Using "Secret Sauce" Processes -- Creating a Process Flow Runsheet -- Leveraging Foundry Process Platforms -- Best Practices for Lithography and Photomask Layout -- Lithography Methods and Parameters -- Photoresist -- Alignment Strategy and Marks -- Setting up the Photomask Layout File -- Design Variants -- Testing, Packaging, and Assembly Layout Considerations -- Planning for Future Die Shrink -- Finalizing a Mask Layout -- Summary -- References -- Chapter 12: Design for Back-end-of-Line Processes -- Wafer Sort -- Wafer Thinning -- Singulation -- Package and Assembly -- Summary -- References -- Chapter 13: Strategies for Codevelopment of the Electronics and Package -- Codevelopment Challenges -- Using Proxies to Enable Parallel Development -- Electronics Development Proxies -- Leveraging Sensor Signal Conditioning (SSC) Chips and Microcontrollers -- System-Side Electronics Interfaces -- Packaging Development Proxies -- Examples of Codevelopment with Proxies -- Summary -- References -- Chapter 14: Planning a Development Test Program -- Understanding Test Types: Development Test vs. Manufacturing Test -- Development Test -- How Testing, Performance, Reliability, Product Qualification, and Failure Analysis Are Related -- Establishing Test Requirements -- Standard Tests can Leverage Existing Equipment and Expertise -- The Role of In-Field Testing in Defining Qualification Tests , Establishing Test Capability -- Characterization Test is a Core Capability -- Developing Characterization Test Capability -- Information Quality vs. Test Speed and Volume -- Testing During vs. Before and After Exposure to Conditions -- Developing for In-Field Test Capability -- Best Practices for Enabling Failure Analysis -- Localize the Problem -- Observation Modes -- Using Test Structures -- Summary -- References -- Chapter 15: Risk Mitigation Strategies for Prototype Fabrication -- Knowing Your Organization's Tolerance for Risk -- Analyze Process Risks and Explore Trade-Offs -- Process Development Risk Mitigation Strategies -- Short loop Process Experiments -- Staging, Split Lots, and Look-Ahead Wafers -- Parallel Lot Processing -- Cost-Effective Planning -- After Spending the Money and Time, Be Sure to Harvest the Data -- Example: Using Fabrication Risk Mitigation Strategies -- Process Risk Mitigation in a Production Fab -- Summary -- References -- Chapter 16: Documenting MEMS Product Technology for Transfer to Manufacturing -- What Needs to Be Documented and Why -- Milestone Design Reviews -- System Functional Diagrams and Schematics -- Simulation Models and Results -- Documentation for MEMS Foundry Transfer -- Photomask Layout Data -- Photomask Layout File -- Photomask Layer Definition -- High-Level Process Flow Summary -- Layout Design Specifications -- MEMS Process Flow -- Runsheet and Process Tolerances -- Inspection and Acceptance Criteria -- Documentation for Other Supply Chain Vendors -- Back End, Packaging, and Other Supply Chain Vendors -- Process Quality Control and Qualification Test Documents -- Summary -- References -- Part IV: Technology Transfer and Scaling Up Manufacturing -- Chapter 17: Determining Readiness for Volume Production -- Understanding Development Versus Production Environments -- Staff Composition and Mindset , Job queuing and Process Stability
    Additional Edition: Erscheint auch als Druck-Ausgabe Fitzgerald, Alissa M. MEMS Product Development Cham : Springer International Publishing AG,c2021 ISBN 9783030617080
    Language: English
    Subjects: Engineering
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    URL: Volltext  (URL des Erstveröffentlichers)
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  • 17
    UID:
    b3kat_BV040126615
    Format: 1 Online-Ressource (XVI, 197 S.) , graph. Darst.
    ISBN: 9780230114319 , 9780230102491
    Series Statement: Perspectives from social economics
    Content: This collection of essays by prominent economists and philosophers showcases the important contributions that markets can make to important topics within social economics, including practical issues such as poverty and disaster relief, as well as more general concerns regarding ethics and well-being
    Note: Document
    Language: English
    Subjects: Economics , Philosophy
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    Keywords: Marktwirtschaft ; Sozialpolitik ; Soziale Probleme ; Ethik ; Unsichtbare Hand ; Aufsatzsammlung
    Author information: White, Mark D. 1971-
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  • 18
    Online Resource
    Online Resource
    New York, NY ; Basingstoke, Hampshire : Palgrave Macmillan
    UID:
    b3kat_BV041572868
    Format: 1 Online-Ressource (XV, 185 Seiten)
    Edition: First edition
    ISBN: 9781137313577
    Note: Dr. Mark D. White explains the informational, ethical, and practical problems faced by libertarian paternalism and 'nudges,' by which the government subtly influences people's choices for their own good, in his exciting new volume "The Manipulation of Choice". In a lighthearted manner, the author points out critical flaws in the way economists model decision-making, how behavioral economics failed to correct them, and how they led to the problems with libertarian paternalism and nudges. Sprinkled throughout with anecdotes, examples, and references to a wide range of scholarly literature, this new volume argues against the use of paternalistic nudges by the government and makes a positive case for individual choice and autonomy
    Additional Edition: Erscheint auch als Druck-Ausgabe, gebunden ISBN 978-1-137-28775-5
    Additional Edition: Erscheint auch als Druck-Ausgabe, kartoniert ISBN 978-1-137-28776-2
    Language: English
    Subjects: Sociology
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    Keywords: Wirtschaft ; Einflussnahme ; Wirtschaftspsychologie ; Politik ; Politische Psychologie
    URL: Volltext  (URL des Erstveröffentlichers)
    Author information: White, Mark D. 1971-
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  • 19
    UID:
    b3kat_BV041963990
    Format: 1 Online-Ressource
    ISBN: 9783540171959
    Series Statement: Lecture notes in physics 266
    Additional Edition: Erscheint auch als Druckausgabe ISBN 978-3-540-47358-9
    Language: English
    Subjects: Physics
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    Keywords: Kompaktes Objekt ; Akkretion ; Astrophysik ; Akkretion ; Konferenzschrift
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  • 20
    UID:
    b3kat_BV011746676
    Format: XI, 161 S. , Ill., graph. Darst.
    ISBN: 0195113136
    Language: English
    Subjects: Biology
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    Keywords: Mikrobiologie ; Methode
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