In:
Materialwissenschaft und Werkstofftechnik, Wiley, Vol. 21, No. 7 ( 1990-07), p. 257-265
Abstract:
A Multi‐Wavelength Method for X‐RAy Analysis of Near Surface Residual States in Ceramics Because of the brittleness of ceramics, their near surface materials state is of particular importance with respect to their strength. Besides of surface topography and microstructure, also the residual stress state has to be taken into account. X‐ray stress analysis has proved to be the most reliable procedure for the determination of near surface residual stress states in ceramics. Often, however, the residually stressed surface layers are very shallow and, despite the small penetration depth of the X‐rays used, only integral values of the existing residual stresses can be measured Consequently, it is difficult to asses the Parameters of the applied Pretreatments which influence the residual stress states. A method is described which works with different X‐ray wavelengths for measuring lattice strains of several sets of {hkl}‐planes of near surface grains to account for very steep stress gradients Corresponding examples of residual stress determinations on machined ceramic surfaces are presented and discussed.
Type of Medium:
Online Resource
ISSN:
0933-5137
,
1521-4052
DOI:
10.1002/mawe.19900210705
Language:
English
Publisher:
Wiley
Publication Date:
1990
detail.hit.zdb_id:
200651-0
detail.hit.zdb_id:
2025930-X
detail.hit.zdb_id:
246726-4
Bookmarklink