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  • MDPI AG  (2)
  • Korshunov, Aleksandr Ivanovich  (2)
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  • MDPI AG  (2)
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  • 1
    In: Applied Sciences, MDPI AG, Vol. 13, No. 5 ( 2023-02-26), p. 2994-
    Abstract: In the present paper, we consider the issue of improving the accuracy of measurements and the peculiar features of the measurements of the geometric parameters of objects by optoelectronic systems, based on a television multiscan in the analogue mode in scanistor enabling. It is shown that the convolution of the input signal of the rectangular profile of the light zone with the impulse response of the multiscan explains the smearing of video signal edges. The value of smearing is completely determined by impulse response and does not depend on the zone width. It is established that signals of the action from narrow light zones are smeared out substantially relative to their width, and in this case, the conventional method for determining the zone width by the video signal derivatives stops working. A method is proposed for a full reconstruction of the rectangular profile of a light zone (including a narrow one) in a developed noise-proof optoelectronic measuring device based on a multiscan with the use of spatio-structural parameters, where the width of a light zone corresponds to an extent, illumination of the zone—to brightness, and its coordinate—to centroid. It is shown that the subtraction of the dissipation of the impulse response from the video signal dissipation allows for accounting of the value of the video signal smearing out with high accuracy at the estimation of the width of a light zone, in accordance with the property of the additive accumulation of dissipation. It is established that the use of the spatio-structural video signal model permits the extension of the application of multiscan-based optoelectronic devices for the high-accuracy control and measurement of the geometric parameters of small objects.
    Type of Medium: Online Resource
    ISSN: 2076-3417
    Language: English
    Publisher: MDPI AG
    Publication Date: 2023
    detail.hit.zdb_id: 2704225-X
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  • 2
    In: Processes, MDPI AG, Vol. 9, No. 1 ( 2020-12-24), p. 24-
    Abstract: The article deals with the issues of improving the accuracy of measurements of the geometric parameters of objects by optoelectronic systems, based on a television multiscan. A mathematical model of a multiscan with scanistor activation is developed, expressions for its integral output current and video signal are obtained, and the mechanism of their formation is investigated. An expression for the video signal is obtained that reflects the dual nature of the discrete–continuous multiscan structure: the video signal can have a discrete (pulse) or analog (continuous) form, depending on the step voltage between the photodiode cells of the multiscan. A Vernier discrete–analog method for measuring the parameters of the light zone on a multiscan is proposed, in which in order to increase the accuracy of the measurements, the location of the video pulse is determined relative to the neighboring reference pulses of a rigid geometric raster due to the slope of the discrete structure of the multiscan. It is established that the Vernier method enables one to make precision measurements of the coordinates, dimensions, and movements of the light zones by an overlay on a video raster of reference pulses from cells—a uniform sequence of Vernier pulses with a recurrence interval, followed by determining the number of the Vernier pulse that coincides with the raster pulse. An optoelectronic device based on a discrete–continuous multiscan, implemented on the basis of the proposed Vernier method of measuring the coordinates of the light zones, which has a high sensitivity to movement, is characteristic of continuous structures, and has increased stability and linearity of the coordinate characteristics typical for discrete structures, is developed.
    Type of Medium: Online Resource
    ISSN: 2227-9717
    Language: English
    Publisher: MDPI AG
    Publication Date: 2020
    detail.hit.zdb_id: 2720994-5
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