In:
Microscopy and Microanalysis, Oxford University Press (OUP), Vol. 9, No. 1 ( 2003-02), p. 36-41
Abstract:
In this article, we show that nanometer-sized precipitates
of atomic numbers higher than those of the surrounding crystalline matrix can be clearly revealed in a conventional transmission
electron microscope by high-angle, centered dark-field imaging after minimizing the diffraction contrast. The effect is similar
to that of Z -contrast STEM, albeit with a spatial resolution
limited to 1 nm. Its sensitivity to atomic number differences between precipitates and matrix is about 10, which is demonstrated
for precipitates formed after Er, Ge, Cr, and Si ion implantation into SiC.
Type of Medium:
Online Resource
ISSN:
1431-9276
,
1435-8115
DOI:
10.1017/S143192760303006X
Language:
English
Publisher:
Oxford University Press (OUP)
Publication Date:
2003
detail.hit.zdb_id:
1481716-0
SSG:
11
SSG:
12
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