In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 35, No. 3R ( 1996-03-01), p. 1712-
Abstract:
We have fabricated superconducting YBa 2 Cu 3 O 7-δ thin films on a Si substrate with metallic buffer layers, SrRuO 3 /PtSi. The T c on is 90 K and the T c 0 is 35 K. The interface shows electrical conductivity with contact resistance 3×10 2 Ω· cm 2 at 293 K. Cross-sectional transmission electron microscopy and Auger electron depth profile show that YBa 2 Cu 3 O 7-δ is protected from reaction with Si. However, SrRuO 3 reacts with PtSi and forms an amorphous layer which has high resistance. The SrRuO 3 and YBa 2 Cu 3 O 7-δ are polycrystalline.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
DOI:
10.1143/JJAP.35.1712
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
1996
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7
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