In:
Advances in X-ray Analysis, Cambridge University Press (CUP), Vol. 35, No. B ( 1991), p. 959-963
Abstract:
The total reflection x-ray fluorescence (TXRF) method of analyzing elemental contents Is based on the small angle irradiation of thin samples placed on a total reflecting backing with a narrow photon beam. Two instrumental problems are to be solved here. The first is to form the narrow beam with a small angular deviation. The usual way to solve this problem is to use collimators with small solid angles. These angles must be less than the critical angle for x-ray total reflection, which, in the energy range 10 - 20 keV has an order of magnitude around 10 −3 rad.
Type of Medium:
Online Resource
ISSN:
0376-0308
,
2631-3626
DOI:
10.1154/S0376030800013161
Language:
English
Publisher:
Cambridge University Press (CUP)
Publication Date:
1991
detail.hit.zdb_id:
2498440-1
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