In:
Open Engineering, Walter de Gruyter GmbH, Vol. 2, No. 1 ( 2012-3-1), p. 123-128
Abstract:
In our investigation, V doped SiO2/TiO2 thin films were prepared on glass substrates by dip coating sol-gel technique. Chemical composition of the samples was studied by X-ray photoelectron spectroscopy (XPS). Transmittance of the samples was characterized using UV-VIS spectrophotometry. Subsequently band-gap energy (Eg) was estimated for these films. Powders obtained from sols were characterized by FTIR spectroscopy. It was found that vanadium decreases optical band gap of SSiO2/TiO2 films.
Type of Medium:
Online Resource
ISSN:
2391-5439
DOI:
10.2478/s13531-011-0041-6
Language:
English
Publisher:
Walter de Gruyter GmbH
Publication Date:
2012
detail.hit.zdb_id:
2825447-8
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