In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 38, No. S1 ( 1999-01-01), p. 612-
Abstract:
Using the BESSY I wavelength shifter (WLS) beamline we have examined the energy resolution of a laterally graded Si 1-x Ge x crystal in the full divergent, white synchrotron beam. At the Fe-K absorption edge (E = 7112 eV) we have measured an energy resolution of E/ΔE=7.1·10 4 for the (440) reflection and a vertical divergence of 0.63 mrad. For a pure Si(440) reference crystal and the same divergence we found E/ΔE=7.1·10 3 which means a factor of 10 improvement in the case of the laterally graded crystal. Similar results have been obtained at the Co-K absorption edge (E = 7710 eV) with an increase of 2.6 for E/ΔE. We present the experimental set-up and a method for the characterization of the absolute lattice parameter with a precision of Δd/d=2·10 -5 . In addition, we discuss the application of the laterally graded Si 1-x Ge x crystals in the crystal monochromator KMC-2 at the BESSY II storage ring.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
DOI:
10.7567/JJAPS.38S1.612
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
1999
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7
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