In:
Surface and Interface Analysis, Wiley, Vol. 42, No. 10-11 ( 2010-10), p. 1520-1523
Abstract:
Surface magic clusters (SMCs) of In on Si(111)‐7 × 7 surfaces and adhesion of subsequently deposited Ag atoms to them, were observed and analyzed by scanning tunneling microscopy (STM), transmission electron microscopy (TEM) and electron energy loss spectroscopy (EELS). Formation of In SMCs on faulted halves of 7 × 7 unit cells was confirmed by both STM images and transmission diffraction patterns. By subsequent Ag deposition, adhesion of Ag atoms onto preexisting In SMCs was observed. Corresponding diffraction pattern suggests that Ag atoms captured in the In SMCs have characteristic atomic structure which is different from known Ag‐In alloy phase. The changes in EELS spectrum are also discussed. Copyright © 2010 John Wiley & Sons, Ltd.
Type of Medium:
Online Resource
ISSN:
0142-2421
,
1096-9918
DOI:
10.1002/sia.v42:10/11
Language:
English
Publisher:
Wiley
Publication Date:
2010
detail.hit.zdb_id:
2023881-2
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