In:
Journal of Materials Research, Springer Science and Business Media LLC, Vol. 15, No. 5 ( 2000-05), p. 1110-1119
Abstract:
The microstructural development of YBa 2 Cu 3 O y (Y-123) coated conductors based on the ion-beam-assisted deposition (IBAD) of yttria-stabilized zirconia (YSZ) to produce a biaxially textured template is presented. The architecture of the conductors was Y-123/CeO 2 /IBAD YSZ/Inconel 625. A continuous and passivating Cr 2 O 3 layer forms between the YSZ layer and the Inconel substrate. CeO 2 and Y-123 are closely lattice-matched, and misfit strain is accommodated at the YSZ/CeO 2 interface. Localized reactions between the Y-123 film and the CeO 2 buffer layer result in the formation of BaCeO 3 , YCuO 2 , and CuO. The positive volume change that occurs from the interfacial reaction may act as a kinetic barrier that limits the extent of the reaction. Excess copper and yttrium generated by the interfacial reaction appear to diffuse along grain boundaries and intercalate into Y-123 grains as single layers of the Y-247, Y-248, or Y-224 phases. The interfacial reactions do not preclude the attainment of high critical currents ( I c ) and current densities ( J c ) in these films nor do they affect to any appreciable extent the nucleation and alignment of the Y-123 film.
Type of Medium:
Online Resource
ISSN:
0884-2914
,
2044-5326
DOI:
10.1557/JMR.2000.0158
Language:
English
Publisher:
Springer Science and Business Media LLC
Publication Date:
2000
detail.hit.zdb_id:
54876-5
detail.hit.zdb_id:
2015297-8
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