In:
Journal of Materials Research, Springer Science and Business Media LLC, Vol. 14, No. 12 ( 1999-12), p. 4677-4684
Abstract:
The epitaxial PbTiO 3 thin films of different thickness were prepared on MgO(001) substrates by the reactive direct-current magnetron sputtering. The volume fraction of c domains, α, which was measured by x-ray diffractometry, increased rapidly from zero with the film thickness, being saturated at about 90% above 100 nm. The films were annealed in a PbO atmosphere at 700 °C for 8 h, and they were used to study the composition change in the Pb/(Pb + Ti) ratio and the relaxation of the residual intrinsic stress. The relationship between change of α and composition was weak. The stress state was calculated through the finite-element method. As for the small thickness, the tensile epitaxial stress overwhelmed compressive intrinsic and thermal stresses, and the domain structure was a -domain oriented. As for the large thickness, the compressive intrinsic stress together with the thermal stress overcame the tensile epitaxial stress, and the population turned into c domain.
Type of Medium:
Online Resource
ISSN:
0884-2914
,
2044-5326
DOI:
10.1557/JMR.1999.0633
Language:
English
Publisher:
Springer Science and Business Media LLC
Publication Date:
1999
detail.hit.zdb_id:
54876-5
detail.hit.zdb_id:
2015297-8
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