In:
Microelectronics Reliability, Elsevier BV, Vol. 49, No. 9-11 ( 2009-9), p. 1090-1095
Type of Medium:
Online Resource
ISSN:
0026-2714
DOI:
10.1016/j.microrel.2009.07.043
Language:
English
Publisher:
Elsevier BV
Publication Date:
2009
detail.hit.zdb_id:
2022028-5
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