In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 31, No. S1 ( 1992-01-01), p. 160-
Abstract:
An amplitude-and-phase-measuring acoustic microscope operating at frequencies higher than 100 MHz has been developed. Complex V ( z ) curves of fused silica and aluminum were measured at 400 MHz with high accuracy. Inverse Fourier transform of each V ( z ) curve was achieved to give the reflectance function of the specimens. The Rayleigh, longitudinal and shear critical angles were obtained from the results. These were in good agreement with the theoretical predictions.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
DOI:
10.7567/JJAPS.31S1.160
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
1992
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7
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