In:
Journal of the American Ceramic Society, Wiley, Vol. 97, No. 9 ( 2014-09), p. 2892-2896
Abstract:
An amorphous phase was formed in a 0.95( Na 0.5 K 0.5 ) NbO 3 –0.05 CaTiO 3 (NKN‐CT) film grown at 300°C, and a low‐temperature transient Ca 2 Nb 2 O 7 phase was formed in the film grown at 500°C. In films grown at high temperatures (≥600°C), secondary phases such as K 5.75 Nb 10.85 O 30 and K 4 Ti 10 Nb 2 O 27 were developed without the formation of a NKN‐CT phase, probably because of Na 2 O evaporation. The same secondary phases were formed in the film grown at 300°C and subsequently annealed at 850°C under an air atmosphere. However, a homogeneous NKN‐CT phase was formed in films grown at 300°C and subsequently annealed at 830°C–880°C under the K 2 O and Na 2 O atmospheres. Moreover, the film annealed at 830°C in particular exhibited good electric and piezoelectric properties, including a high dielectric constant of 747 with a low dissipation factor of 0.93% at 100 kHz, low leakage current density of 2.0 × 10 −7 A/cm 2 at 0.1 MV/cm, and high P r and d 33 values of 15.4 μC/cm 2 and 124 pm/V at 100 kV/cm, respectively.
Type of Medium:
Online Resource
ISSN:
0002-7820
,
1551-2916
DOI:
10.1111/jace.2014.97.issue-9
Language:
English
Publisher:
Wiley
Publication Date:
2014
detail.hit.zdb_id:
2008170-4
detail.hit.zdb_id:
219232-9
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