In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 36, No. 8A ( 1997-08-01), p. L1003-
Abstract:
Using a method based on the measurement of below-threshold cavity loss and optical power, we experimentally determine the spontaneous emission factor of 850 nm gain-guided vertical-cavity surface-emitting lasers. Since our method needs only below-threshold information, we can avoid complex problems concerning above-threshold effects and obtain more reliable results. It is also pointed out that the typical L-I curve-fitting method results in unreliable estimation of the spontaneous emission factor. The values of spontaneous emission factors obtained are 6.6, 4.1, and 2.4 ×10 -4 for 10-, 15-, and 20-µm-diameter circular aperture VCSELs, respectively.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
DOI:
10.1143/JJAP.36.L1003
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
1997
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7
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