In:
Applied Physics Letters, AIP Publishing, Vol. 90, No. 2 ( 2007-01-08)
Abstract:
The authors propose and demonstrate a simple nondestructive technique that allows characterizing precisely the thermal properties of semiconductor lasers. The method consists of performing transmission measurements with a probe beam end fire coupled into one of the waveguide facets. Fabry-Perot oscillations occur as the cavity temperature varies, allowing for a time-resolved characterization of heating and dissipation processes. This leads to a very accurate knowledge of the thermal behavior of a third-order-mode semiconductor laser proposed for intracavity nonlinear processes.
Type of Medium:
Online Resource
ISSN:
0003-6951
,
1077-3118
Language:
English
Publisher:
AIP Publishing
Publication Date:
2007
detail.hit.zdb_id:
211245-0
detail.hit.zdb_id:
1469436-0
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