In:
Defect and Diffusion Forum, Trans Tech Publications, Ltd., Vol. 386 ( 2018-9), p. 131-136
Abstract:
Nowadays, the magneto-ellipsometry technique is considered as a promising tool for studying nanostructures. It leads to a great demand of both designing set-ups for conducting experiments and developing approaches to data processing. The later one is a problem in framework of in situ analysis as it would be useful to have an approach to data analysis which is reliable, quick and reasonably easy. This work continues our previous study of layered nanostructures by means of magneto-ellipsometry technique and logically generalizes the approach to magneto-ellipsometry data analysis for the multi-layered model use. As a result, the algorithm with detailed description of necessary formulae is presented.
Type of Medium:
Online Resource
ISSN:
1662-9507
DOI:
10.4028/www.scientific.net/DDF.386
DOI:
10.4028/www.scientific.net/DDF.386.131
Language:
Unknown
Publisher:
Trans Tech Publications, Ltd.
Publication Date:
2018
detail.hit.zdb_id:
2051135-8
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