In:
VLSI Design, Hindawi Limited, Vol. 2010 ( 2010-02-16), p. 1-12
Abstract:
An instrumentation channel is designed, implemented, and tested in a 0.5- μ m SiGe BiCMOS process. The circuit features a reconfigurable Wheatstone bridge network that interfaces an assortment of external sensors to signal processing circuits. Also, analog sampling is implemented in the channel using a flying capacitor configuration. The analog samples are digitized by a low-power multichannel A/D converter. Measurement results show that the instrumentation channel supports input signals up to 200 Hz and operates across a wide temperature range of - 180 ° C to 125 ° C . This work demonstrates the use of a commercially available first generation SiGe BiCMOS process in designing circuits suitable for extreme environment applications.
Type of Medium:
Online Resource
ISSN:
1065-514X
,
1563-5171
Language:
English
Publisher:
Hindawi Limited
Publication Date:
2010
detail.hit.zdb_id:
2022068-6
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