In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 40, No. 6S ( 2001-06-01), p. 4354-
Abstract:
Scanning nonlinear dielectric microscopy (SNDM) is the first successful purely electrical method for observing the ferroelectric domain on the sub-nanometer order. As another high-resolution method for measuring ferroelectric domains, the piezoelectric response imaging method is often reported. In this study, it is confirmed that SNDM has a much higher resolution than piezoelectric imaging under the same experimental condition using the same system. First, the resolution of SNDM is described, and then, the resolution of SNDM is compared with that of piezoelectric imaging. Finally, a fundamental study for applying the SNDM system to a ferroelectric reading-recording system is performed, and it is concluded that SNDM has sufficient performance for application to the ferroelectric memory system.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
DOI:
10.1143/JJAP.40.4354
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
2001
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7
Bookmarklink