In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 40, No. 7B ( 2001-07-01), p. L718-
Abstract:
A novel technique, energy dispersive near edge X-ray absorption fine structure (NEXAFS) spectroscopy, has been successfully developed by using a position sensitive electron analyzer and a new soft X-ray beamline constructed at the bending magnet in the Photon Factory. It was revealed that the NEXAFS spectra can be obtained even for submonolayer adsorbates with an accumulation period of ∼ 30 s. As the first application of the new technique, coverage dependence of C-K-edge NEXAFS spectra were recorded in situ for thiophene adsorption on Au(111).
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
DOI:
10.1143/JJAP.40.L718
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
2001
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7
Bookmarklink