In:
Applied Physics Letters, AIP Publishing, Vol. 72, No. 18 ( 1998-05-04), p. 2328-2330
Abstract:
The application of high temperature superconductor (HTS) Josephson junctions in digital rapid single flux quantum circuits requires a careful study of the influence of thermal noise on the bit error rate (BER). We have determined experimentally, for the first time, the BER of a HTS rapid single flux quantum circuit. A comparator, formed by two Josephson junctions, was integrated in a Josephson transmission line ring oscillator, allowing us to perform high speed testing of the comparator at GHz frequencies. For fabrication, focused-electron-beam-irradiated junctions have been used because of their small parameter spread and excellent alignment possibilities. A BER of less than 10−11 was obtained at 39 K.
Type of Medium:
Online Resource
ISSN:
0003-6951
,
1077-3118
Language:
English
Publisher:
AIP Publishing
Publication Date:
1998
detail.hit.zdb_id:
211245-0
detail.hit.zdb_id:
1469436-0
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