In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 39, No. 5S ( 2000-05-01), p. 3086-
Abstract:
The theory for quantitative measurement of linear and nonlinear dielectric constants using scanning nonlinear dielectric microscopy is explained in this paper.
Using this theory, quantitative measurements for linear and nonlinear dielectric constants of dielectric materials were performed successfully.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
DOI:
10.1143/JJAP.39.3086
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
2000
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7
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