In:
Applied Physics Letters, AIP Publishing, Vol. 102, No. 3 ( 2013-01-21)
Abstract:
The room-temperature thermal resistance of model low-angle (0001) twist bicrystal Al2O3 grain boundaries was measured as a function of misorientation angle using the 3ω thermal conductivity testing technique. The work yields interfacial thermal resistances of 0.44 × 10−8, 1.2 × 10−8, and 1.54 × 10−8 Km2 W−1 for the ∼1.3°, ∼8.0°, and ∼13° twist grain boundaries, respectively. The interfacial thermal resistance correlates with the grain boundary energy calculated from the Read-Shockley model. The results indicate significant anisotropy in the Kapitza resistance whose magnitude is dominated by local structural defects at the grain boundary rather than spectral mismatch between grains.
Type of Medium:
Online Resource
ISSN:
0003-6951
,
1077-3118
Language:
English
Publisher:
AIP Publishing
Publication Date:
2013
detail.hit.zdb_id:
211245-0
detail.hit.zdb_id:
1469436-0
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