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Critique of: “A Parallel Framework for Constraint-Based Bayesian Network Learning via Markov Blanket Discovery” by SCC Team From UC San Diego

Gupta, Arunav ; Ge, John ; Li, John ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2023

In: IEEE Transactions on Parallel and Distributed Systems Vol. 34, No. 6 ( 2023-6), p. 1727-1730

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In: IEEE Transactions on Parallel and Distributed Systems, Institute of Electrical and Electronics Engineers (IEEE), Vol. 34, No. 6 ( 2023-6), p. 1727-1730

Type of Medium: Online Resource

ISSN: 1045-9219 , 1558-2183 , 2161-9883

URL: Article

DOI: 10.1109/TPDS.2022.3217284

RVK:

SQ 1100

RVK:

SA 1000

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2023

detail.hit.zdb_id: 2027774-X

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