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  • 1
    Book
    Book
    Magnetic imaging and its applications to materials (2001)
    San Diego [u.a.] : Academic Press
    Details
    UID:
    gbv_1614075581
    Format: XVI, 295 Seiten , Illstrationen
    ISBN: 0124759831
    Series Statement: Experimental methods in the physical sciences 36
    Content: Zhu, Jian-Gang; Micromagnetic modeling of domain structures in magnetic thin films
    Content: Graef, Marc de; Lorentz Microscopy: theoretical basis and image simulations
    Content: Gomez, Romel D.; Recent advances in magnetic force microscopy: quantification and in situ field measurements
    Content: McCartney, M. R.; Electron holography and its application to magnetic materials
    Content: Barty, Anton; Phase retrieval in Lorentz Microscopy
    Content: Unguris, John; Scanning electron microscopy with polarization analysis (SEMPA) and its applications
    Content: Yajima, Yusuke; High resolution Lorentz scanning transmision electron microscopy and its applications
    Content: Zhu, Yimei; Magnetic structure and magnetic imaging of Re2Fe14B (RE=Nd, permanent magnets
    Note: Literaturverz. S. 271 - 285
    Additional Edition: Erscheint auch als Online-Ausgabe Magnetic imaging and its applications to materials San Diego : Academic Press, 2001 ISBN 9780124759831
    Additional Edition: ISBN 0124759831
    Language: English
    Subjects: Physics
    RVK:
    UX 1300
    Keywords: Mikroskopie ; Magnetwerkstoff ; Mikroskopie ; Magnetkraftmikroskopie
    Library Location Call Number Volume/Issue/Year Availability
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  • 2
    Online Resource
    Online Resource
    Introduction to Conventional Transmission Electron Microscopy (2003)
    Cambridge : Cambridge University Press
    Details
    UID:
    gbv_883406306
    Format: Online-Ressource (1 online resource (742 p.)) , digital, PDF file(s).
    Edition: Online-Ausg.
    ISBN: 9780511615092
    Content: This 2003 book covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. Emphasis is on the experimental and computational methods used to quantify and analyze CTEM observations. A supplementary website containing interactive modules and free Fortran source code accompanies the text. The book starts with the basics of crystallography and quantum mechanics providing a sound mathematical footing for the rest of the text. The next section deals with the microscope itself, describing the various components in terms of the underlying theory. The second half of the book focuses on the dynamical theory of electron scattering in solids including its applications to perfect and defective crystals, electron diffraction and phase contrast techniques. Based on a lecture course given by the author in the Department of Materials Science and Engineering at Carnegie Mellon University, the book is ideal for graduate students as well as researchers new to the field
    Note: Title from publisher's bibliographic system (viewed on 05 Oct 2015)
    Additional Edition: ISBN 9780521620062
    Additional Edition: ISBN 9780521629959
    Additional Edition: Erscheint auch als Druck-Ausgabe De Graef, Marc, 1961 - Introduction to conventional transmission electron microscopy Cambridge [u.a.] : Cambridge Univ. Press, 2003 ISBN 0521620066
    Additional Edition: ISBN 0521629950
    Additional Edition: Erscheint auch als Druck-Ausgabe ISBN 9780521620062
    Language: English
    Subjects: Physics
    RVK:
    UH 6300
    Keywords: Durchstrahlungselektronenmikroskopie
    DOI: 10.1017/CBO9780511615092
    URL: Volltext
    Library Location Call Number Volume/Issue/Year Availability
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    Online Resource
    Online Access
    Open Access Request
    UB Potsdam
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