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  • 1
    UID:
    b3kat_BV040446019
    Format: XIV, 583 S. , graph. Darst.
    Edition: 2. ed.
    ISBN: 9781608071005
    Series Statement: Artech optoelectronics and applied optics series
    Language: English
    Subjects: Engineering
    RVK:
    Keywords: Infrarottechnik ; Elektrooptik ; Konferenzschrift
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  • 2
    Online Resource
    Online Resource
    Boston ; : Artech House, | [Piscataqay, New Jersey] :IEEE Xplore,
    UID:
    almafu_9959246069902883
    Format: 1 online resource (600 p.)
    Edition: Second edition.
    ISBN: 1-60807-101-4
    Series Statement: Artech optoelectronics and applied optics series
    Content: This newly revised and updated edition of a classic Artech House book offers a current and complete introduction to the analysis and design of Electro-Optical (EO) imaging systems. The Second Edition provides numerous updates and brand new coverage of today's most important areas, including the integrated spatial frequency approach and a focus on the weapons of terrorists as objects of interest. This comprehensive reference details the principles and components of the Linear Shift-Invariant (LSI) infrared and electro-optical systems and shows you how to combine this approach with calculus and d.
    Note: Description based upon print version of record. , Introduction to Infrared and Electro-Optical Systems; Contents; Preface; Chapter 1 Introduction; 1.1 Introduction to Imaging; 1.2 Infrared and EO Systems; 1.3 Wavelength Dependencies; 1.4 Typical EO Scenario; 1.5 Typical Infrared Scenario; 1.6 Analytical Parameters; 1.7 Sensitivity and Resolution; 1.8 Linear Systems Approach; 1.9 Summary; 1.10 Guide to the References; References; Chapter 2 Mathematics; 2.1 Complex Functions; 2.2 Common One-Dimensional Functions; 2.3 Two-Dimensional Functions; 2.4 Convolution and Correlation; 2.5 The Fourier Transform; 2.6 Properties of the Fourier Transform. , 2.7 Transform Pairs2.8 Probability; 2.9 Important Examples; 2.10 Guide to the References; 2.11 Exercises; References; Software; Chapter 3 Linear Shift-Invariant Systems; 3.1 Linear Systems; 3.2 Shift Invariance; 3.3 Basics of LSI Systems; 3.4 Impulse Response; 3.5 Transfer Function; 3.6 System PSF and MTF Versus Component PSF and MTF; 3.7 Spatial Sampling; 3.8 Spatial Sampling and Resolution; 3.9 Sampled Imaging Systems; 3.10 Guide to the References; 3.11 Exercises; References; Chapter 4 Diffraction; 4.1 Electromagnetic Waves; 4.2 Coherence. , 4.3 Fresnel and Fraunhofer Diffraction from an ApertureFresnel Diffraction; Fraunhofer Diffraction; 4.4 Fraunhofer Diffraction from a Thin Lens; 4.5 Thin Lens Optical System Diffraction Psf; 4.6 Thin Lens Diffraction Mtf; Modulation and Modulation Transfer Function; Incoherent Diffraction MTF; Coherent Diffraction MTF; 4.7 Calculating Diffraction Mtf with Pencil and Paper; Circular Pupil: Coherent MTF; Circular Pupil: Incoherent MTF; 4.8 Programs for Calculating Incoherent Diffraction Mtf; 4.9 Applications of Diffraction Theory; 4.10 Exercises; References; Chapter 5 Sources of Radiation. , 5.1 Radiometry and PhotometryRadiometric Units; Photometric Units; 5.2 Infrared Targets and Backgrounds; Blackbody Radiation; Emissivity; Equivalent Differential Temperature (Delta T); Apparent Differential Temperature (Apparent Delta T); Technique 1: Temperature-Broadband Beer's Law Product; Technique 2: Temperature-Broadband Transmission as a Function of Range; Technique 3: Flux-Broadband Beer's Law Product; Technique 4: Flux-Temperature Differential; 5.3 Electro-Optical Targets and Backgrounds; External Sources; Contrast; 5.4 Other Sensitivity Considerations. , Bidirectional Reflectance Distribution FunctionColor Considerations; 5.5 Target and Background Spatial Characteristics; Bar Target Representation of Targets; Target Delta T and Characteristic Dimension; Summary of Target Characteristics; Clutter; Simulation of Target Characteristics; 5.6 Typical Midwave and Longwave Contrasts and Solar Effects; 5.7 Exercises; References; Chapter 6 Atmospherics; 6.1 Atmospheric Components and Structure; 6.2 Atmospheric Transmission; 6.3 Absorption; 6.4 Scattering; 6.5 Path Radiance; 6.6 Turbulence; 6.7 Atmospheric MTF; 6.8 Models; 6.9 Model Discussion. , Also available in print. , English
    Additional Edition: ISBN 1-60807-100-6
    Language: English
    Keywords: Electronic books.
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  • 3
    Book
    Book
    New York [u.a.] : Dekker
    Show associated volumes
    UID:
    gbv_364982497
    ISBN: 0824709403 , 0824742583
    Note: 2. Aufl. u.d.T.: Encyclopedia of optical and photonic engineering
    Language: English
    Keywords: Technische Optik
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  • 4
    UID:
    almahu_9948312985802882
    Format: xv, 304 p. : , ill.
    Edition: Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
    Series Statement: Artech House optoelectronics series
    Note: pt. 1. Basic principles of imaging systems and performance -- pt. 2. Basic principles of signal processing -- pt. 3. Advanced applications.
    Language: English
    Keywords: Electronic books.
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  • 5
    Online Resource
    Online Resource
    Bellingham, Wash. (1000 20th St. Bellingham WA 98225-6705 USA) :SPIE,
    UID:
    almahu_9947418285202882
    Format: 1 online resource (xiv, 288 p. : ill.) : , digital file.
    ISBN: 9780819480781 (electronic)
    Series Statement: Tutorial texts series ; v. TT87
    Content: Advancing technology in detector arrays, flat panel displays, and digital image processing provides new opportunities to expand imaging applications and enhance system performance. Technical managers and design engineers are faced with evaluating the cost, weight, and performance of an ever-expanding selection of technology options. This tutorial text provides the theory, procedures, and information necessary to evaluate and compare the performance of available imaging technologies. Part I updates the earlier work presented in Analysis of Sampled Imaging Systems (2000). Part II discusses performance evaluation of electro-optical imagers. Part III provides computer programs (on a supplemental CD-ROM) and up-to-date information on detector arrays, optics, and display options.
    Note: "SPIE digital library." , Part I. Analysis of sampled imaging systems. Chapter 1. The sampling process -- 1.1. Description of a sampled imager -- 1.2. Description of the sampling process -- 1.3. Linearity and shift invariance -- 1.4. Signal reconstruction -- 1.5. Three ways of viewing the sampling process. -- 1.5.1. The displayed image as the sum of its parts; -- 1.5.2. The display as a filter of the image samples; -- 1.5.3. The display as a filter of the sampled image -- 1.6. The sampling theorem. -- 1.6.1. Theory; -- 1.6.2. Example; -- 1.6.3. Discussion -- Bibliography. , Chapter 2. Fourier integral representation of an optical image.2.1. Linear shift-invariant optical systems -- 2.2. Equivalence of spatial and frequency domain filters -- 2.3. Reducing LSI imager analysis to one dimension -- 2.4. Perspectives on one-dimensional analysis -- 2.5. Imager modulation transfer functions. 2.5.1. Imager components; 2.5.2. Line-of-sight jitter; 2.5.3. Electronic stabilization; 2.5.4. Motion blur; 2.5.5. Field replication; 2.5.6. Analog electronic filters; 2.5.7. Display MTF -- Bibliography. , Chapter 3. Sampled Imager Response Function. 3.1. Fourier transform of a sampled image -- 3.2. The sampled imager response function -- 3.3. Examples of sampled imager response functions. 3.3.1. Example 1: The pictures of Lena in Chapter 1; 3.3.2. Example 2: Effect of changing sample rate; 3.3.3. Example 3: Midwave thermal imager; 3.3.4. Example 4: Two-dimensional SIR example -- Bibliography. , Chapter 4 Sampled imager optimization. 4.1. Interpolation Implementation -- Bibliography. , Chapter 5. Interlace and dither. 5.1. Sampling improvement with static scene -- 5.2. Resolution and sensitivity -- 5.3. Effect of scene-to-sensor motion -- Bibliography. , Part II. Evaluating the performance of electro-optical imagers. Chapter 6. Quantifying visual task performance. 6.1. Specifying and evaluating field performance -- 6.2. Factors that influence target identification -- 6.3. Measuring target signatures -- 6.4. Experimental procedure -- 6.5. Field test procedure -- 6.6. Test sets other than tactical vehicles -- 6.7. Field testing using bar targets. , Chapter 7. Evaluating imager resolution. 7.1. Imager evaluation procedure -- 7.2. Modeling gain, level, and the user interface -- 7.3. Observer vision -- 7.4. Predicting probability of identification. 7.4.1. Comparing experimental data to model predictions -- 7.5. Test sets other than tactical vehicles -- Bibliography. , Chapter 8. Quantifying the effect of aliasing on visual task performance. 8.1. Model treatment of spatial noise -- 8.2. Treatment of temporal noise in detectivity versus photon-counting models -- 8.3. Relating target and imager coordinate systems -- 8.4. Spatial scaling of aliasing noise - Bibliography. , Chapter 9. Thermal imager topics. 9.1. Effective blackbody temperature -- 9.2. Signal and noise in the detectivity model -- 9.3. Thermal imager contrast threshold function -- 9.4. Adding aliasing noise -- 9.5. Predicting range performance -- 9.6. Modeling contrast enhancement and boost -- 9.7. Minimum resolvable temperature. 9.7.1. Predicting minimum resolvable temperature; 9.7.2. Predicting sampled imager minimum resolvable temperature; 9.7.3. Improving the minimum resolvable temperature procedure -- Bibliography. , Chapter 10. Imagers of reflected light. 10.1. Calculating target set contrast -- 10.2. System contrast threshold function. 10.2.1. Interlace; 10.2.2. Snapshot and frame integration -- 10.3. Predicting Range Performance -- Bibliography. , Part III. Applications. Chapter 11. Computer programs and application data. 11.1. Optics modulation transfer function.11.1.1. Thermal imagers; 11.1.2. Imagers of reflected light -- 11.2. Display modulation transfer function. 11.2.1. Cathode ray tubes; 11.2.2. Liquid crystal displays; 11.2.3. Display interface format -- 11.3. Atmospheric transmission and turbulence. 11.3.1. Atmosphere in the reflective model; 11.3.2. Atmosphere in the thermal model; 11.3.3. Atmospheric turbulence -- 11.4. Detector calculations. 11.4.1. Detector noise; 11.4.2. Detector modulation transfer function -- 11.5. Computer program description -- 11.6. Imager analysis using the programs. 11.6.1. Imager resolution; 11.6.2. System contrast threshold function; 11.6.3. Range plots -- References -- Bibliography. , Chapter 12. Infrared focal plane arrays.12.1. Photon detector infrared focal plane arrays. 12.1.1. Photon detector basic principles; 12.1.2. Readout integrated circuit; 12.1.3. Photon detector dark current -- 12.2. IR FPA performance characterization. 12.2.1. Responsivity and detectivity background-limit performance; 12.2.2. Flux-based signal-to-noise ratio -- 12.3. Commonly available photon detector FPAs. 12.3.1. Indium antimonide (InSb) detectors; 12.3.2. Quantum well infrared photoconductor (QWIP) detectors; 12.3.3. Mercury cadmium telluride (HgCdTe) detectors -- 12.4. Uncooled detectors. 12.4.1. Introduction; 12.4.2. Signal-to-noise ratio and performance limits; 12.4.3. Typical uncooled detectors -- References. , Appendix. Observer vision model. A.1. Contrast threshold function -- A.2. Engineering model of the eye -- References -- Index. , Also available in print version. , Mode of access: World Wide Web. , System requirements: Adobe Acrobat Reader.
    Additional Edition: ISBN 0819480770
    Additional Edition: ISBN 9780819480774
    Language: English
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  • 6
    Online Resource
    Online Resource
    Bellingham, Wash. (1000 20th St. Bellingham WA 98225-6705 USA) :SPIE,
    UID:
    almahu_9947418290802882
    Format: 1 online resource (xv, 176 p. : ill.) : , digital file.
    ISBN: 9780819478580 (electronic)
    Series Statement: Tutorial texts in optical engineering ; v. TT 39
    Content: Advances in solid state detector arrays, flat panel displays, and digital image processing have prompted an increasing variety of sampled imaging products and possibilities. These technology developments provide new opportunities and problems for the design engineer and system analyst--this tutorial's intended reader.
    Note: "SPIE digital library." , 1. Introduction -- Description of a sampled imager -- Description of the sampling process -- Linearity and shift invariance -- Signal reconstruction -- Three ways of viewing the sampling process. , 2. Fourier integral representation of an optical image -- Linear, shift-invariant optical systems -- Spatial and frequency domain filters -- Reducing LSI imager analysis to one dimension -- The MTF associated with typical imager components -- Temporal filters. , 3. Sampled imager response function -- Fourier transform of a sampled image -- Derivation of the sampled imager response function -- Examples of sampled imager response functions -- Definition and calculation of the spurious response ratio. , 4. Sampled imager design and optimization -- Interpolation and image reconstruction -- Classical design criteria for sampled imaging systems -- Minimum resolvable temperature difference, miminum resolvable contrast, and the half-sample limit -- MTF squeeze -- Sampled imager optimization. , 5. Interlace and dither -- Sampling improvement with static scene -- Resolution and sensitivity -- Effect of scene to sensor motion. , 6. Dynamic sampling, resolution enhancement, and super resolution, contributed by Jonathon M. Schuler and Dean A. Scribner -- Introduction -- Sampling limitations of the focal plane array topology -- Dynamic sampling -- Ambient optical flow as a novel sampling mechanism -- Image restoration -- Conclusion. , 7. The Sampling Theorem -- Theory -- Example -- Discussion. , 8. Laboratory measurements of sampled infrared imaging system performance -- Classical infrared imager performance measurements -- Sampled infrared imager performance measurements -- Appendix A: Fourier series and Fourier integrals -- Fourier series -- Fourier integral -- Appendix B: The impulse function -- Definition -- Properties of the impulse function. , Also available in print version. , System requirements: Adobe Acrobat Reader. , Mode of access: World Wide Web.
    Additional Edition: ISBN 0819434892
    Language: English
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  • 7
    UID:
    almahu_9949568686202882
    Format: 1 online resource (716 pages) : , illustrations
    Edition: Third edition.
    ISBN: 9781630818333
    Additional Edition: Print version: Driggers, Ronald G. Introduction to infrared and electro-optical systems. Boston, MA : Artech House, c2022 ISBN 9781630818326
    Language: English
    Keywords: Electronic books.
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  • 8
    UID:
    gbv_372129722
    Format: XVI, S. 2049 - 3049, 55 S , Ill., graph. Darst
    ISBN: 0824742524 , 0824742583 , 082470939X
    In: Vol. 3
    Language: English
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  • 9
    UID:
    gbv_372129463
    Format: XVI, 1024, 55 S , Ill., graph. Darst
    ISBN: 0824742508 , 0824742583 , 082470939X
    In: Vol. 1
    Language: English
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  • 10
    UID:
    gbv_372129609
    Format: XVI, S. 1025 - 2047, 55 S , Ill., graph. Darst
    ISBN: 0824742516 , 0824742583 , 082470939X
    In: Vol. 2
    Language: English
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