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  • 1
    Book
    Book
    New York :Springer,
    UID:
    almahu_BV019525120
    Format: XXII, 263 S. : Ill., graph. Darst.
    Edition: 2. ed.
    ISBN: 0-387-22045-3 , 978-0-387-22045-1
    Series Statement: Mechanical engineering series
    Note: Literaturangaben
    Language: English
    Subjects: Engineering , Physics
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    Keywords: Dünne Schicht ; Härteeindruck ; Nanometerbereich ; Dünne Schicht ; Elastizitätsmodul ; Messung ; Nanometerbereich ; Dünne Schicht ; Mechanische Eigenschaft ; Werkstoffprüfung ; Nanometerbereich ; Dünne Schicht ; Härteprüfung ; Nanometerbereich
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  • 2
    Book
    Book
    New York [u.a.] : Springer
    UID:
    b3kat_BV013135776
    Format: XXI, 243 S. , Ill., graph. Darst.
    ISBN: 0387989145
    Series Statement: Mechanical engineering series
    Language: English
    Subjects: Physics
    RVK:
    Keywords: Festkörpermechanik ; Kontakt
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  • 3
    Book
    Book
    New York [u.a.] : Springer
    UID:
    b3kat_BV014570229
    Format: XX, 197 S. , Ill., graph. Darst. : 25 cm
    ISBN: 0387953949
    Series Statement: Mechanical engineering series
    Note: Literaturangaben
    Language: English
    Subjects: Engineering , Physics
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    Keywords: Dünne Schicht ; Härteprüfung ; Nanometerbereich ; Dünne Schicht ; Elastizitätsmodul ; Messung ; Nanometerbereich ; Dünne Schicht ; Mechanische Eigenschaft ; Werkstoffprüfung ; Nanometerbereich ; Dünne Schicht ; Härteeindruck ; Nanometerbereich
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  • 4
    Online Resource
    Online Resource
    Oxford ; : Newnes,
    UID:
    almahu_9948025416802882
    Format: 1 online resource (307 p.)
    Edition: 1st edition
    ISBN: 1-281-01408-7 , 9786611014087 , 0-08-049745-4
    Content: Tony Fischer-Cripps is a Project Leader in the Division of Telecommunications and Industrial Physics of the CSIRO (Commonwealth Scientific & Industrial Research Organisation), Australia. He was previously lecturer, University of Technology, Sydney (UTS), Australia, and has also worked for the National Institute of Standards and Technology, USA (NIST, formerly National Bureau of Standards - NBS).*The essential pocket reference for engineers and students*Interfacing in action: PCs, PLCs, transducers and instrumentation in one book*Develop systems and applications that work with N
    Note: Description based upon print version of record. , Front Cover; Newnes Interfacing Companion; Copyright Page; Contents; Preface; Part 1: Transducers; Chapter 1.1. Measurement systems; 1.1.1 Transducers; 1.1.2 Methods of measurement; 1.1.3 Sensitivity; 1.1.4 Zero, linearity and span; 1.1.5 Resolution, hysteresis and error; 1.1.6 Fourier analysis; 1.1.7 Dynamic response; 1.1.8 PID control; 1.1.9 Accuracy and repeatability; 1.1.10 Mechanical models; 1.1.11 Review questions; Chapter 1.2. Temperature; 1.2.1 Temperature; 1.2.2 Standard thermometers; 1.2.3 Industrial thermometers; 1.2.4 Platinum resistance thermometer , 1.2.5 Liquid-in-glass thermometer1.2.6 Radiation pyrometer; 1.2.7 Thermocouple; 1.2.8 Thermistors; 1.2.9 Relative humidity; 1.2.10 Review questions; 1.2.11 Activities; Chapter 1.3. Light; 1.3.1 Light; 1.3.2 Measuring light; 1.3.3 Standards of measurement; 1.3.4 Thermal detectors; 1.3.5 Light dependent resistor; 1.3.6 Photodiode; 1.3.7 Other semiconductor photodetectors; 1.3.8 Optical detectors; 1.3.9 Photomultiplier; 1.3.10 Review questions; Chapter 1.4. Position and motion; 1.4.1 Mechanical switch; 1.4.2 Potentiometric sensor; 1.4.3 Capacitive transducer; 1.4.4 LVDT , 1.4.5 Angular velocity transducer1.4.6 Position sensitive diode array; 1.4.7 Motion control; 1.4.9 Review questions; Chapter 1.5. Force, pressure and flow; 1.5.1 Strain gauge; 1.5.2 Force; 1.5.3 Piezoelectric sensor instrumentation; 1.5.4 Acceleration and vibration; 1.5.5 Mass; 1.5.6 Atmospheric pressure; 1.5.7 Pressure; 1.5.8 Industrial pressure measurement; 1.5.9 Sound; 1.5.10 Flow; 1.5.11 Level; 1.5.12 Review questions; Part 2: Interfacing; Chapter 2.1. Number systems; 2.1.1 Binary number system; 2.1.2 Decimal to binary conversion; 2.1.3 Hexadecimal; 2.1.4 Decimal to hex conversion , 2.1.5 2's complement2.1.6 Signed numbers; 2.1.7 Subtraction and multiplication; 2.1.8 Binary coded decimal; 2.1.9 Gray code; 2.1.10 ASCII code; 2.1.11 Boolean algebra; 2.1.12 Digital logic circuits; 2.1.13 Review questions; 2.1.14 Activities; Chapter 2.2. Computer architecture; 2.2.1 Computer architecture; 2.2.2 Memory; 2.2.3 Segmented memory; 2.2.4 Memory data; 2.2.5 Buffers; 2.2.6 Latches; 2.2.7 Flip-flop; 2.2.8 Input/Output (I/O); 2.2.9 Microprocessor unit (MPU/CPU); 2.2.10 Registers; 2.2.11 ROM; 2.2.12 Interrupts; 2.2.13 Memory map; 2.2.14 Real and protected mode CPU operation , 2.2.15 Review questions2.2.16 Activities; Chapter 2.3. Assembly language; 2.3.1 Instruction set; 2.3.2 Assembly language; 2.3.3 Program execution; 2.3.4 Assembly language program structure; 2.3.5 Assembler directives; 2.3.6 Code segment; 2.3.7 Assembly language shell program; 2.3.8 Branching; 2.3.9 Register and immediate addressing; 2.3.10 Memory addressing; 2.3.11 Indirect memory addressing; 2.3.12 Indexed memory addressing; 2.3.14 Interrupts; 2.3.15 Review questions; 2.3.16 Activities; Chapter 2.4. Interfacing; 2.4.1 Interfacing; 2.4.2 Input/Output ports; 2.4.3 Polling; 2.4.4 Interrupts , 2.4.5 Direct memory access (DMA) , English
    Additional Edition: ISBN 0-7506-5720-0
    Language: English
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  • 5
    Online Resource
    Online Resource
    New York [u.a.] : Springer
    UID:
    b3kat_BV023186882
    Format: 1 Online-Ressource
    Edition: 2. ed.
    ISBN: 9780387681870 , 9780387681887
    Series Statement: Mechanical engineering series
    Language: English
    Subjects: Physics
    RVK:
    Keywords: Festkörpermechanik ; Kontakt
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  • 6
    Book
    Book
    New York [u.a.] : Taylor & Francis
    UID:
    b3kat_BV022785050
    Format: V, 200 S. , zahlr. graph. Darst.
    ISBN: 1584886803 , 9781584886808
    Content: "Providing a working understanding of materials physics without the typical lengthy and exhaustive discussions found in other books. The Materials Physics Companion offers an accessible introduction to the most important concepts of materials physics. Following the style of the author's other companions, this book maintains a reader-friendly format and takes a straightforward approach when presenting difficult topics. It illustrates key concepts and principles of materials science and solid state physics in clear, one-page, figure-rich descriptions. Designed as a supplementary text and revision aid, the book contains many worked examples and review questions throughout."--BOOK JACKET.
    Language: English
    Subjects: Physics
    RVK:
    Keywords: Festkörperphysik ; Physik ; Materie ; Physik ; Werkstoff ; Lehrbuch
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  • 7
    Book
    Book
    New York, NY [u.a.] : Springer-Verlag
    UID:
    kobvindex_ZLB15403987
    Format: XXII, 279 Seiten , graph. Darst.
    Edition: 3. ed.
    ISBN: 9781441998712
    Series Statement: Mechanical engineering series
    Note: Text engl.
    Language: English
    Keywords: Dünne Schicht ; Nanometerbereich ; Dünne Schicht ; Elastizitätsmodul ; Messung ; Nanometerbereich ; Dünne Schicht ; Mechanische Eigenschaft ; Werkstoffprüfung ; Nanometerbereich
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  • 8
    Online Resource
    Online Resource
    New York, NY [u.a.] : Springer
    UID:
    b3kat_BV040124586
    Format: 1 Online-Ressource
    Edition: 3. ed.
    ISBN: 9781441998729
    Series Statement: Mechanical engineering series
    Additional Edition: Erscheint auch als Online-Ausgabe ISBN 978-1-4419-9871-2
    Language: English
    Subjects: Engineering , Chemistry/Pharmacy , Physics
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    Keywords: Dünne Schicht ; Härteprüfung ; Nanometerbereich ; Dünne Schicht ; Elastizitätsmodul ; Messung ; Nanometerbereich ; Dünne Schicht ; Mechanische Eigenschaft ; Werkstoffprüfung ; Nanometerbereich ; Dünne Schicht ; Härteeindruck ; Nanometerbereich
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  • 9
    Online Resource
    Online Resource
    New York, NY : Springer New York
    UID:
    b3kat_BV045149063
    Format: 1 Online-Ressource (XXII, 264 p)
    Edition: Second Edition
    ISBN: 9781475759433
    Series Statement: Mechanical Engineering Series
    Content: There has been considerable interest in the last two decades in the mechanical characterisation of thin film systems and small volumes of material using depth-sensing indentation tests. Usually, the principal goal of such testing is to obtain values for elastic modulus and hardness of the specimen material from experimental readings of indenter load and depth of penetration. But other properties such as residual stress, fracture toughness, and visco-elastic behavior may also be measured. The indentation technique can be used on both brittle and ductile materials where conventional testing may result in premature specimen fracture. The forces involved are usually in the millinewton range and measured with a resolution of a few nanonewtons while the depths of penetration are in the order of nanometres, hence the term "nanoindentation". This new edition of Nanoindentation includes: * A dedicated chapter on thin films * New material on dynamic analysis and creep * Accounts of recent research * Three new appendices on nonlinear least squares fitting, frequently asked questions, and specifications for a nanoindentation instrument. Nanoindentation Second Edition is intended for those who are entering the field for the first time and to act as a reference for those already conversant with the technique. About the Author: Anthony C. Fischer-Cripps, Ph.D. is the Project Leader for Surface Mechanics, Telecommunications & Industrial Physics at Commonwealth Scientific & Industrial Research Organization in Lindfield, Sydney, Australia
    Additional Edition: Erscheint auch als Druck-Ausgabe ISBN 9781441919625
    Language: English
    Keywords: Dünne Schicht ; Elastizitätsmodul ; Messung ; Nanometerbereich ; Dünne Schicht ; Mechanische Eigenschaft ; Werkstoffprüfung ; Nanometerbereich ; Dünne Schicht ; Härteprüfung ; Nanometerbereich ; Dünne Schicht ; Härteeindruck ; Nanometerbereich
    URL: Volltext  (URL des Erstveröffentlichers)
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  • 10
    Online Resource
    Online Resource
    New York, NY : Springer New York
    UID:
    b3kat_BV045148597
    Format: 1 Online-Ressource (XX, 198 p. 42 illus)
    ISBN: 9780387224626
    Series Statement: Mechanical Engineering Series
    Content: Mechanical engineering, an engineering discipline borne of the needs of the industrial revolution, is once again asked to do its substantial share in the call for industrial renewal. The general call is urgent as we face profound issues of productivity and competitiveness that require engineering solutions, among others. The Mechanical Engineering Series features graduate texts and research monographs intended to address the need for information in contemporary areas of mechanical engineering. The series is conceived as a comprehensive one that covers a broad range of concentrations important to mechanical engineering graduate education and research. We are fortunate to have a distinguished roster of consulting editors on the advisory board, each an expert in one of the areas of concentration. The names of the consulting editors are listed on the facing page of this volume. The areas of concentration are: applied mechanics; biomechanics; computational mechanics; dynamic systems and control; energetics; mechanics of materials; processing; thermal science; and tribology
    Additional Edition: Erscheint auch als Druck-Ausgabe ISBN 9781489905154
    Language: English
    Keywords: Dünne Schicht ; Elastizitätsmodul ; Messung ; Nanometerbereich ; Dünne Schicht ; Mechanische Eigenschaft ; Werkstoffprüfung ; Nanometerbereich ; Dünne Schicht ; Härteprüfung ; Nanometerbereich ; Dünne Schicht ; Härteeindruck ; Nanometerbereich
    URL: Volltext  (URL des Erstveröffentlichers)
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