Kooperativer Bibliotheksverbund

UID:

Format: 1 Online-Ressource (316 p.) , 159 b&w, ill

ISBN: 1847557929 , 9781847557926

Note: Chemical characterisation techniques have been essential tools in nanotechnology in recent years and Nanocharacterisation is a rapidly developing field, Chemical characterisation techniques have been essential tools in underpinning the explosion in nanotechnology in recent years and nanocharacterisation is a rapidly developing field. Contributions in this book from leading teams across the globe provide an overview of the different microscopic techniques now in regular use for the characterisation of nanostructures. Essentially a handbook to all working in the field this indispensable resource provides a survey of microscopy based techniques with experimental procedures and extensive examples of state of the art characterisation methods including: " Transmission Electron Microscopy " Electron Tomography " Tunneling Microscopy " Electron Holography " Electron Energy Loss Spectroscopy This timely publication will appeal to academics, professionals and anyone working fields related to the research and development of nanocharacterisation and nanotechnology

Language: English

Subjects: Physics

Keywords: Nanostrukturiertes Material ; Elektronenmikroskopie

URL: Volltext

URL: Volltext  (Deutschlandweit zugänglich)

UID:

Format: XVIII, 336 S. , Ill., graph. Darst.

ISBN: 0792399897

Language: English

Subjects: Engineering , Physics

Keywords: Elektronenmikroskopie ; Werkstoffprüfung

URL: Inhaltsverzeichnis

UID:

Format: XVIII, 336 p. 183 illus. , online resource.

Edition: 1st ed. 1997.

ISBN: 9781461562153

Content: 2. High Temperature UHV-STM System 264 3. Hydrogen Desorption Process on Si (111) Surface 264 4. (7x7) - (1 xl) Phase Transition on Si (111) Surface 271 Step Shifting under dc Electric Fields 275 5. 6. Conclusions 280 Acknowledgements and References 281 12. DYNAMIC OBSERVATION OF VORTICES IN SUPERCONDUCTORS USING ELECTRON WAVES 283 by Akira Tonomura 1. Introduction 283 2. Experimental Method 284 2. 1 Interference Microscopy 284 2. 2 Lorentz Microscopy 287 Observation of Superconducting Vortices 288 3. 3. 1 Superconducting Vortices Observed by Interference Microscopy 288 3. 1. 1 Profile Mode 288 3. 1. 2 Transmission Mode 291 3. 2 Superconducting Vortices Observed by Lorentz Microscopy 293 3. 3 Observation of Vortex Interaction with Pinning Centers 294 3. 3. 1 Surface Steps 295 3. 3. 2 Irradiated Point Defects 296 4. Conclusion 298 References 299 13. TEM STUDIES OF SOME STRUCTURALLY FLEXIBLE SOLIDS AND THEIR ASSOCIATED PHASE TRANSFORMATIONS 301 by Ray L. Withers and John G. Thompson 1. Introduction 301 2. Tetrahedrally Comer-Connected Framework Structures 302 3. Tetragonal a-PbO 311 4. Compositionally Flexible Anion-Deficient Fluorites and the "Defect Fluorite" to C-type Sesquioxide Transition 320 5. Summary and Conclusions 327 Acknowledgements and References 327 Author Index 331 Subject Index 333 List of Contributors A. ASEEV Institute of Semiconductor Physics, Russian Academy of Sciences Novosibirsk, 630090, pr. ac. , Lavrentjeva 13, RUSSIA E. BAUER Department of Physics and Astronomy, Arizona State University Tempe, AZ 85287-1504, U. S. A. G. H.

Note: 1. In-Situ Applications of Low Energy Electron Microscopy (Leem) -- 1. Introduction -- 2. Phase Transitions on Clean Surfaces -- 3. Segregation -- 4. Gas-Surface Interactions -- 5. Epitaxy -- 6. Summary -- Acknowledgements and References -- 2. Environmental Scanning Electron Microscopy -- 1. Introduction -- 2. Gas Dynamics -- 3. Electron Beam Transfer -- 4. Contrast and Resolution -- 5. Detection -- 6. Cathodoluminescence -- 7. X-rays -- 8. Beam Irradiation Effects -- 9. Operation and Applications -- 10. Conclusions -- Acknowledgements and References -- 3. ESEM Development and Application In Cultural Heritage Conservation -- 1. Introduction -- 2. Applications -- 3. ESEM and SEM: Operational Differences -- 4. ESEM/EDS Development (1990-1997) -- 5. Future Work -- Acknowledgements and References -- 4. Intrinsic Point Defect Clustering In Si: A Study by HVEM and HREM In-Situ Electron Irradiation -- 1. Introduction -- 2. Experimental Details -- 3. Results and Discussion -- 4. Conclusion -- Acknowledgements and References -- 5. In-Situ Observation and Quantitative Analysis of Electromigration Void Dynamics -- 1. Introduction -- 2. Sample Fabrication and In-Situ Test Technique -- 3. Single Void Behavior -- 4. Void-Void Interactions -- 5. Void-Hillock Interactions -- 6. Summary and Conclusions -- Acknowledgements and References -- 6. Environmental High Resolution Electron Microscopy (EHREM) In Materials Science -- 1. Introduction -- 2. Experimental: In-Situ Controlled Environmental High Resolution Transmission EM (EHREM) Development for Gas-Solid Reactions on the Atomic Scale -- 3. Applications -- 4. Conclusions -- Acknowledgements and References -- 7. In-Situ Transmission Electron Microscopy of Thin Film Growth -- 1. Introduction -- 2. Role of TEM in Studies of Thin Film Growth -- 3. Instrumental Approaches -- 4. Some Results -- 5. Conclusions -- Acknowledgements and References -- 8. HREM In-Situ Experiment at Very High Temperatures -- 1. Introduction -- 2. Specimen-Heating Holders -- 3. Electron Microscope -- 4. HREM Observation of Si Particle just below the Melting Point -- 5. Formation of SiC through Solid State Chemical Reactions -- between Si and Graphite -- 6. Sintering of SiC Crystals -- 7. Surface Reconstruction of Au-deposited Si -- 9. In-Situ REM and TEM Studies of Homo and Hetero-Epitaxy on Si Surfaces -- 1. Introduction -- 2. Experimental -- 3. Results and Discussion -- 4. Conclusions -- References -- 10. Atomic-Scale Fabrication of Metal Surfaces by Adsorption and Chemical Reaction -- 1. Introduction -- 2. Fabrication of Metal Surfaces by Physical Processes -- 3. Fabrication of Metal Surfaces by Chemical Reaction -- 4. Nano-meter Scale Patterning by Chemical Reactions -- References -- 11. High Temperature Dynamic Behavior of Silicon Surfaces Studied by Scanning Tunneling Microscopy (STM) -- 1. Introduction -- 2. High Temperature UHV-STM System -- 3. Hydrogen Desorption Process on Si (111) Surface -- 4. (7×7) - (1×1) Phase Transition on Si (111) Surface -- 5. Step Shifting under dc Electric Fields -- 6. Conclusions -- Acknowledgements and References -- 12. Dynamic Observation of Vortices in Superconductors Using Electron Waves -- 1. Introduction -- 2. Experimental Method -- 3. Observation of Superconducting Vortices -- 4. Conclusion -- References -- 13. TEM Studies of Some Structurally Flexible Solids and Their Associated Phase Transformations -- 1. Introduction -- 2. Tetrahedrally Corner-Connected Framework Structures -- 3. Tetragonal ?-PbO -- 4. Compositionally Flexible Anion-Deficient Fluorites -- and the "Defect Fluorite" to C-type Sesquioxide Transition -- 5. Summary and Conclusions -- Acknowledgements and References -- Author Index.

In: Springer Nature eBook

Additional Edition: Printed edition: ISBN 9781461562160

Additional Edition: Printed edition: ISBN 9781461378501

Additional Edition: Printed edition: ISBN 9780792399896

Language: English

DOI: 10.1007/978-1-4615-6215-3

URL: https://doi.org/10.1007/978-1-4615-6215-3

UID:

Format: Online-Ressource (316 p) , 159 b&w, ill

Edition: Online-Ausg. RSC eBook Collection 1968-2009

ISBN: 1847557929 , 9781847557926

Series Statement: RSC Nanoscience & Nanotechnology v.3

Content: Chemical characterisation techniques have been essential tools in nanotechnology in recent years and Nanocharacterisation is a rapidly developing field, Chemical characterisation techniques have been essential tools in underpinning the explosion in nanotechnology in recent years and nanocharacterisation is a rapidly developing field. Contributions in this book from leading teams across the globe provide an overview of the different microscopic techniques now in regular use for the characterisation of nanostructures. Essentially a handbook to all working in the field this indispensable resource provides a survey of microscopy based techniques with experimental procedures and extensive examples of state of the art characterisation methods including: " Transmission Electron Microscopy " Electron Tomography " Tunneling Microscopy " Electron Holography " Electron Energy Loss Spectroscopy This timely publication will appeal to academics, professionals and anyone working fields related to the research and development of nanocharacterisation and nanotechnology

Note: Ebook , 9780854042418; i_iv; v_viii; ix_xiv; 001_027; 028_065; 066_093; 094_137; 138_183; 184_267; 268_290; 291-304 , Chapter 1: Characterization of Nanomaterials using Transmission Electron Microscopy-- 1.1 Introduction-- 1.2 Imaging-- 1.2.1 Transmission Electron Microscopy-- 1.2.2 High-resolution electron Microscopy-- 1.2.3 Basis of High-resolution Imaging-- 1.2.4 Resolution Limits-- 1.2.5 Lattice Imaging or Atomic Imaging-- 1.2.6 Instrumental Parameters-- 1.3 Survey of Applications-- 1.3.1 Developments in HREM-- 1.3.2 Small Particles and Precipitates-- 1.3.3 Two-dimensional Objects-- 1.3.4 One-dimensional Objects-- 1.3.5 Zero-dimensional Objects-- 1.3.6 Surfaces and Interfaces-- 1.4 Emerging Trends and Practical Concerns-- 1.4.1 Atomic Location and Quantitative Imaging-- 1.4.2 Detection and Correction of Aberrations-- 1.4.3 Stobbs' Factor-- 1.4.4 Radiation Damage-- 1.5 Conclusions-- Acknowledgements-- References-- Chapter 2: Scanning Transmission Electron Microscopy-- 2.1 Introduction-- 2.1.1 Basic Description-- 2.1.2 Detectors-- 2.1.3 Electron Energy-loss Spectroscopy-- 2.2 Aberration-corrected STEM-- 2.2.1 The Aberration Function-- 2.2.2 Spherical and Chromatic Aberration-- 2.2.3 Aberration Correctors-- 2.2.4 What Do We See in a STEM?-- 2.2.5 Measuring Aberrations-- 2.2.6 Phonons-- 2.2.7 Resolution-- 2.2.8 Three-dimensional Microscopy-- 2.2.9 Channeling-- 2.3 Applications to Nanostructure Characterisation in Catalysis-- 2.3.1 Anomalous Pt-Pt Distances in the Pt/alumina Catalytic Systems-- 2.3.2 La Stabilisation of Catalytic Supports-- 2.3.3 CO Oxidation by Supported Noble-metal Nanoparticles-- 2.4 Summary and Outlook-- Acknowledgements-- References-- Chapter 3: Scanning Tunneling Microscopy of Surfaces and Nanostructures-- 3.1 History of the STM-- 3.2 The Tunneling Interaction and Basic Operating Principles of STM-- 3.3 Atomic-resolution Imaging of Surface Reconstructions-- 3.4 Imaging of Surface Nanostructures-- 3.5 Manipulation of Adsorbed Atoms and Molecules-- 3.6 Influence of the Surface Electronic States on STM Images-- 3.7 Tunneling Spectroscopy-- 3.8 Tip Artefacts in STM Imaging-- 3.9 Conclusions-- References-- Chapter 4: Electron Energy-loss Spectroscopy and Energy Dispersive X-ray Analysis-- 4.1 What is Nanoanalysis?-- 4.2 Nanoanalysis in the Electron Microscope-- 4.2.1 General Instrumentation-- 4.3 X-ray Analysis in the TEM-- 4.3.1 Basics of X-ray Analysis-- 4.3.2 Analysis and Quantification of X-ray Emission Spectra-- 4.3.3 Application to the Analysis of Nanometre Volumes in the S/TEM-- 4.3.4 Related Photon Emission Techniques in the TEM-- 4.4 Basics of EELS-- 4.4.1 Instrumentation for EELS-- 4.4.2 Basics of the EEL Spectrum-- 4.4.3 Quantification of EELS - The Determination of Chemical Composition-- 4.4.4 Determination of Electronic Structure and Bonding-- 4.4.5 Application to the Analysis of Nanometre Volumes in the S/TEM-- 4.5 EELS Imaging-- 4.6 Radiation Damage-- 4.7 Emerging Techniques-- 4.8 Conclusions-- References-- Chapter 5: Electron Holography of Nanostructured Materials-- 5.1.1 Basis of Off-axis Electron Holography-- 5.1.2 Experimental Considerations-- 5.2 The Mean Inner Potential Contribution to the Phase Shift-- 5.3 Measurement of Magnetic Fields-- 5.3.1 Early Experiments-- 5.3.2 Experiments Involving Digital Acquisition and Analysis-- 5.4 Measurement of Electrostatic Fields-- 5.4.1 Electrically Biased Nanowires-- 5.4.2 Dopant Potentials in Semiconductors-- 5.4.3 Space-charge Layers at Grain Boundaries-- 5.5 High resolution Electron Holography-- 5.6 Alternative Forms of Electron Holography-- 5.7 Discussion, Prospects for the Future and Conclusions-- Acknowledgements-- References-- Chapter 6: Electron Tomography-- 6.1 Introduction-- 6.2 Theory of Electron Tomography-- 6.2.1 From Projection to Reconstruction-- 6.2.2 Backprojection: Real-space Reconstruction-- 6.2.3 Constrained Reconstructions-- 6.2.4 Reconstruction Resolution-- 6.2.5 Measuring Reconstruction Resolution-- 6.2.6 The Projection Requirement-- 6.3 Acquiring Tilt Series-- 6.3.1 Instrumental Considerations-- 6.3.2 Specimen Support and Positioning-- 6.3.3 Specimen Considerations-- 6.4 Alignment of Tilt Series-- 6.4.1 Alignment by Tracking of Fiducial Markers-- 6.4.2 Alignment by Crosscorrelation-- 6.4.3 Rotational Alignment without Fiducial Markers-- 6.4.4 Other Markerless Alignment Techniques-- 6.5 Visualisation, Segmentation and Data Mining-- 6.5.1 Visualisation Techniques-- 6.5.2 Volume Rendering-- 6.5.3 Segmentation-- 6.5.4 Quantitative Analysis-- 6.6 Imaging Modes-- 6.6.1 Bright-field TEM-- 6.6.2 Dark-field (DF) Tomography-- 6.6.3 HAADF STEM-- 6.6.4 Meeting the Projection Requirement-- 6.6.5 Experimental Considerations-- 6.6.6 Limitations-- 6.6.7 Core-loss (Chemical Mapping) EFTEM-- 6.6.8 Low-loss EFTEM-- 6.6.9 Energy Dispersive X-ray (EDX) Mapping-- 6.6.10 Holographic Tomography-- 6.7 New Techniques-- 6.7.1 Electron Energy-loss Spectroscopy (EELS) Spectrum Imaging-- 6.7.2 Confocal STEM-- 6.7.3 Atomistic Tomography-- 6.8 Conclusions-- References-- Chapter 7: In-situ Environmental (Scanning) Transmission Electron Microscopy-- 7.1 Introduction-- 7.2 Background-- 7.3 Recent Advances in Atomic-resolution In-situ ETEM-- 7.4 Impact of the Atomic-resolution In-situ ETEM and Global Applications-- 7.5 Applications of Atomic-resolution In-situ ETEM in the Studies of Gas-Catalyst and Liquid-Catalyst Reactions-- 7.5.1 Liquid-phase Hydrogenation and Polymerisation Reactions-- 7.5.2 Development of Nanocatalysts for Novel Hydrogenation Chemistry and Dynamic Imaging of Desorbed Organic Products in Liquid-phase Reactions-- 7.5.3 Butane Oxidation Technology-- 7.5.4 In-situ Observations of Carbon Nanotubes (CNTs) in Chemical and Thermal Environments-- 7.6 Conclusions-- Acknowledgements-- References-- Subject Index--.

Additional Edition: Erscheint auch als Druck-Ausgabe Nanocharacterisation

Language: English

Subjects: Physics

Keywords: Nanostrukturiertes Material ; Elektronenmikroskopie ; Electronic books

URL: Volltext  (Deutschlandweit zugänglich)

URL: Volltext