Kooperativer Bibliotheksverbund

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Format: 24 S. : , graph. Darst.

Series Statement: Wirtschafts- und sozialkundliche Unterrichtsmodelle 4

Note: Aus: Gegenwartskunde ; 1961,4

Language: German

Subjects: Economics , Political Science

Keywords: Schulbuch

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Format: 183 S , Ill., graph. Darst

Edition: Als Ms. gedr

Series Statement: Forschungsbericht / Deutsche Forschungsanstalt für Luft- und Raumfahrt e.V. 96,28

Note: Zugl.: Stuttgart, Univ., Diss., 1996

Language: German

Keywords: Strukturmechanik ; Neuronales Netz ; Hochschulschrift ; Forschungsbericht

URL: Inhaltsverzeichnis

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Format: xv, 303 Seiten , Illustrationen, Diagramme

ISBN: 9780081000403

Series Statement: Woodhead Publishing series in electronic and optical materials numer 88

Additional Edition: Erscheint auch als Online-Ausgabe ISBN 978-0-08-100057-1

Language: English

Subjects: Engineering

Keywords: Zerstörungsfreie Werkstoffprüfung

URL: Inhaltsverzeichnis

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Format: 183 S. , graph. Darst.

Edition: Als Ms. gedr.

Series Statement: Deutsche Forschungsanstalt für Luft- und Raumfahrt 〈Köln〉: Forschungsbericht 1996,28

Note: Zsfassung in engl. Sprache. - Zugl.: Stuttgart, Univ., Diss., 1996

Language: German

Keywords: Strukturmechanik ; Neuronales Netz ; Hochschulschrift

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Format: 24 S.m.Abb.

Series Statement: Beiträge zur Sozialkunde. Reihe A. Wirtschafts- u. Sozialpolitik. 4.

Language: German

Subjects: Economics

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Format: 1 online resource (322 p.)

ISBN: 0-08-100057-X

Series Statement: Woodhead Publishing Series in Electronic and Optical Materials ; Number 88

Note: Description based upon print version of record. , 1.6 Application of AFM for material characterization1.6.1 Surface properties measurement; 1.6.2 AFM measurements for hardness and modulus measurements; 1.6.3 AFM measurements for damage characterizations; 1.6.4 AFM measurements for characterizations of surface treatment effects; 1.7 Conclusions; Acknowledgments; References; 2 - Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) for materials characterization; 2.1 Introduction; 2.2 Why electron microscopy?; 2.2.1 Key advantages of imaging with electrons; 2.2.2 Key disadvantages of imaging with electrons , 2.3 Types of microscopes2.4 Interaction of electrons with materials; 2.4.1 Elastic versus inelastic electron scattering; 2.4.2 Signals from the specimen; 2.5 What material features can we analyze using electron microscopy?; 2.5.1 Practical electron microscopy; 2.6 Scanning electron microscopy; 2.6.1 Key features of the SEM microscope; 2.6.2 Specimen preparation; 2.6.3 SEM detectors; 2.7 Key microstructural features analyzed by SEM; 2.7.1 Specimen shape; 2.7.2 Specimen composition; 2.7.3 Surface crystallography; 2.8 Transmission electron microscopy; 2.8.1 Key features of the TEM microscope , 2.8.2 TEM specimen preparation2.9 TEM imaging modes; 2.10 TEM spectroscopy; 2.10.1 X-ray analysis in TEM (EDX); 2.10.2 Electron energy loss spectrometry; 2.11 Key applications of TEM; 2.12 Is electron microscopy a nondestructive technique?; 2.12.1 Specimen preparation; 2.12.2 Specimen changes during imaging; 2.12.3 Strategies for minimizing specimen damage; 2.13 Outlook for SEM and TEM; References; 3 - X-ray microtomography for materials characterization; 3.1 Introduction; 3.2 Imaging physics; 3.2.1 X-ray microfocus tubes; 3.2.2 Interaction of hard X-rays with materials , 3.2.2.1 X-ray attenuationPhoton absorption; Compton scattering; 3.2.2.2 Phase contrast imaging; 3.2.3 X-ray detectors and imaging devices: principles, features, and common systems; 3.3 Principles of microcomputed tomography; 3.4 Geometrical considerations and data acquisition; 3.5 System design (CT methods); 3.6 Image reconstruction; 3.7 Image quality; 3.8 Radiation exposure; 3.9 Examples of important and/or frequent applications for materials characterization; 3.10 Conclusions and future trends; 3.11 Further literature; References , 4 - X-ray diffraction (XRD) techniques for materials characterization

Additional Edition: ISBN 0-08-100040-5

Language: English

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Format: 1 online resource (322 p.)

ISBN: 0-08-100057-X

Series Statement: Woodhead Publishing Series in Electronic and Optical Materials ; Number 88

Note: Description based upon print version of record. , 1.6 Application of AFM for material characterization1.6.1 Surface properties measurement; 1.6.2 AFM measurements for hardness and modulus measurements; 1.6.3 AFM measurements for damage characterizations; 1.6.4 AFM measurements for characterizations of surface treatment effects; 1.7 Conclusions; Acknowledgments; References; 2 - Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) for materials characterization; 2.1 Introduction; 2.2 Why electron microscopy?; 2.2.1 Key advantages of imaging with electrons; 2.2.2 Key disadvantages of imaging with electrons , 2.3 Types of microscopes2.4 Interaction of electrons with materials; 2.4.1 Elastic versus inelastic electron scattering; 2.4.2 Signals from the specimen; 2.5 What material features can we analyze using electron microscopy?; 2.5.1 Practical electron microscopy; 2.6 Scanning electron microscopy; 2.6.1 Key features of the SEM microscope; 2.6.2 Specimen preparation; 2.6.3 SEM detectors; 2.7 Key microstructural features analyzed by SEM; 2.7.1 Specimen shape; 2.7.2 Specimen composition; 2.7.3 Surface crystallography; 2.8 Transmission electron microscopy; 2.8.1 Key features of the TEM microscope , 2.8.2 TEM specimen preparation2.9 TEM imaging modes; 2.10 TEM spectroscopy; 2.10.1 X-ray analysis in TEM (EDX); 2.10.2 Electron energy loss spectrometry; 2.11 Key applications of TEM; 2.12 Is electron microscopy a nondestructive technique?; 2.12.1 Specimen preparation; 2.12.2 Specimen changes during imaging; 2.12.3 Strategies for minimizing specimen damage; 2.13 Outlook for SEM and TEM; References; 3 - X-ray microtomography for materials characterization; 3.1 Introduction; 3.2 Imaging physics; 3.2.1 X-ray microfocus tubes; 3.2.2 Interaction of hard X-rays with materials , 3.2.2.1 X-ray attenuationPhoton absorption; Compton scattering; 3.2.2.2 Phase contrast imaging; 3.2.3 X-ray detectors and imaging devices: principles, features, and common systems; 3.3 Principles of microcomputed tomography; 3.4 Geometrical considerations and data acquisition; 3.5 System design (CT methods); 3.6 Image reconstruction; 3.7 Image quality; 3.8 Radiation exposure; 3.9 Examples of important and/or frequent applications for materials characterization; 3.10 Conclusions and future trends; 3.11 Further literature; References , 4 - X-ray diffraction (XRD) techniques for materials characterization

Additional Edition: ISBN 0-08-100040-5

Language: English

UID:

Format: 1 online resource (322 p.)

ISBN: 0-08-100057-X

Series Statement: Woodhead Publishing Series in Electronic and Optical Materials ; Number 88

Note: Description based upon print version of record. , 1.6 Application of AFM for material characterization1.6.1 Surface properties measurement; 1.6.2 AFM measurements for hardness and modulus measurements; 1.6.3 AFM measurements for damage characterizations; 1.6.4 AFM measurements for characterizations of surface treatment effects; 1.7 Conclusions; Acknowledgments; References; 2 - Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) for materials characterization; 2.1 Introduction; 2.2 Why electron microscopy?; 2.2.1 Key advantages of imaging with electrons; 2.2.2 Key disadvantages of imaging with electrons , 2.3 Types of microscopes2.4 Interaction of electrons with materials; 2.4.1 Elastic versus inelastic electron scattering; 2.4.2 Signals from the specimen; 2.5 What material features can we analyze using electron microscopy?; 2.5.1 Practical electron microscopy; 2.6 Scanning electron microscopy; 2.6.1 Key features of the SEM microscope; 2.6.2 Specimen preparation; 2.6.3 SEM detectors; 2.7 Key microstructural features analyzed by SEM; 2.7.1 Specimen shape; 2.7.2 Specimen composition; 2.7.3 Surface crystallography; 2.8 Transmission electron microscopy; 2.8.1 Key features of the TEM microscope , 2.8.2 TEM specimen preparation2.9 TEM imaging modes; 2.10 TEM spectroscopy; 2.10.1 X-ray analysis in TEM (EDX); 2.10.2 Electron energy loss spectrometry; 2.11 Key applications of TEM; 2.12 Is electron microscopy a nondestructive technique?; 2.12.1 Specimen preparation; 2.12.2 Specimen changes during imaging; 2.12.3 Strategies for minimizing specimen damage; 2.13 Outlook for SEM and TEM; References; 3 - X-ray microtomography for materials characterization; 3.1 Introduction; 3.2 Imaging physics; 3.2.1 X-ray microfocus tubes; 3.2.2 Interaction of hard X-rays with materials , 3.2.2.1 X-ray attenuationPhoton absorption; Compton scattering; 3.2.2.2 Phase contrast imaging; 3.2.3 X-ray detectors and imaging devices: principles, features, and common systems; 3.3 Principles of microcomputed tomography; 3.4 Geometrical considerations and data acquisition; 3.5 System design (CT methods); 3.6 Image reconstruction; 3.7 Image quality; 3.8 Radiation exposure; 3.9 Examples of important and/or frequent applications for materials characterization; 3.10 Conclusions and future trends; 3.11 Further literature; References , 4 - X-ray diffraction (XRD) techniques for materials characterization

Additional Edition: ISBN 0-08-100040-5

Language: English

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Format: 97 Seiten , Taf. , 8°

Note: im Sammelordner , Halle, Univ., naturwiss. Diss. v. 15. Dez. 1927

Additional Edition: Elektronische Reproduktion Herrmann, Hans Georg Der Aufwand an menschlicher Arbeit in der Landwirtschaft und seine Schwankungen im Laufe des Jahres, untersucht für die verschiedenen Betriebsgrößen an 21 Betrieben in der Umgebung der Städte Langensalza und Mühlhausen (Thüringen) für die Jahre 1922 bis 1925 Halle (Saale) : Otto Thiele, Buch- und Kunstdruckerei, 1927

Language: German

Keywords: Hochschulschrift