Format:
1 Online-Ressource (vii, 279 pages)
,
illustrations
Edition:
[S.l.] HathiTrust Digital Library Electronic reproduction
Note:
"IEEE catalog no. 75CH0931-6 PHY
,
Includes bibliographical references
,
Use copy Restrictions unspecified star MiAaHDL
,
Electronic reproduction
,
Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.
Additional Edition:
Print version International Reliability Physics Symposium (13th : 1975 : Las Vegas, Nev.) Reliability physics 1975 New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, ©1975
Language:
English
Keywords:
Konferenzschrift
URL:
http://purl.oclc.org/DLF/benchrepro0212
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