UID:
almafu_9960112694402883
Format:
1 online resource (564 p.)
Edition:
Reprint 2021
ISBN:
9783112500989
Series Statement:
Physica status solidi / A. ; Volume 55, Number 2
Note:
Frontmatter --
,
Classification Scheme --
,
PROFESSOR Dr. Dr. h.c. HEINZ BETHGE --
,
Contents --
,
Original Papers --
,
On Cluster Mobilities in Nucleation and Growth Processes of Epitaxial Thin Films --
,
On the Saturation Cluster Density in Deposition of Thin Films from Vapours --
,
Conditions of Step Decoration on Crystal Surfaces --
,
Observation of NaCl-LiCl High-Temperature Phases by Gold Decoration on the Solid-Melt Interface of Czochralski Grown Crystals --
,
On the Gold Decoration of KCl:Pb Crystal Surfaces --
,
Observation and Interpretation of Spirals for Spiral Growth from the Liquid State --
,
Monte-Carlo Simulation of Dendritic Growth from the Melt --
,
Formation of Aluminium Thin Films in the Presence of Oxygen and Nickel --
,
Sulphur Segregation on the (111) Iron Surface Studied by LEED, AES, and WFC --
,
Stationary Stochastic Adparticle Flip-Flop as a Precursor to Surface Diffusion --
,
A Theory of the Snoek-Köster Relaxation (Cold-Work Peak) in Metals --
,
Cross Slip of Single Dissociated Screw Dislocations in Silicon and Germanium --
,
Aggregation and Precipitation Hardening in NaCl : Ca Crystals --
,
Formation of Radiation-Induced Voids on Dislocations in LiF --
,
TEM Studies of Displacement Cascades in Ion-Bombarded Cu3Pd and Fe3Al --
,
Precipitation and Dissolution Processes in Age-Hardenable A1 Alloys. A Comparison of Positron Annihilation and X-Ray Small-Angle Scattering Investigations (I) --
,
Problems of the Formation of Dislocation Structures in Heteroepitaxial Layers --
,
Crack Propagation in MgO during In-Situ Deformation in the High-Voltage Electron Microscope --
,
Microstructure Dependence of the Brittle Fracture of Alumina --
,
Penetration and Resolution of STEM and CTEM in Amorphous and Polycrystalline Materials --
,
Methodical Aspects of HVEM in In-Situ Experiments in the Field of Condensed Matter --
,
The Role of Environmental Conditions in In-Situ Experiments in the High-Voltage Electron Microscope --
,
On the Determination of Intergranular Orientation Relationships by Kikuchi Electron Diffraction --
,
Analysis of Many-Beam Lattice Images of Y - A l Garnet Crystals --
,
Dislocation Emission in CdS --
,
Measurements of Microfields on Semiconductors --
,
Alignment of Defects in Ge Implanted with Te+ Ions --
,
On X-Ray and Electron Microscopic Characterization of Lattice Defects in AIIBVI Semiconductor Compounds --
,
Combined Scanning (EBIC) and Transmission Electron Microscopic Investigations of Dislocations in Semiconductors --
,
Vieillissement dynamique dans l'alliage Fe-Co-2%V --
,
Influence of the Lattice Component on the Thermal Conductivity Minimum of Aluminium --
,
Electronic Conduction in Dye-Sensitized Selenium Films --
,
The Effect of Ag Impurity on the Real Structure of ZnTe --
,
Distribution of Ion-Bombardment Implanted 85Kr in Si, Cu, and SiO2 --
,
Photoconductive Properties of Sputtered TiO2 Films --
,
On the Theory of Double Injection in Semiconductors with Continuous Distribution of Trapping Levels within the Gap --
,
On the Room Temperature Stability of Metastable Phases Formed at 200 °C in Al-Zn Alloys --
,
Imaging Hexagonal Based Superstructures. A New Stable Orthorhombic Structure in the Au-Mn System --
,
The Phenomenon of Controllable Hydrogen Phase "Naklep" of Metals and Alloys --
,
On the Electrical Activity of Oxygen in Silicon --
,
Electron Microscopic Study of the Domain Structure and of the Transition State in Cu0.5In2.5Se4 --
,
Spectroscopic Study of Phase Polymorphism and Vibrational Assignments for 2,2-Dinitropropane --
,
A Study of Thermal Conversion of Interstitials in Platinum by Means of Electrical Resistivity Measurements --
,
TEM Method for Identification of Domains in Materials Which Undergo a Pm3m -〉 R3c or R3c Phase Transition --
,
The Stress Relaxation of Polyvinyl Chloride in the Macrodeformation Range --
,
Magnetostriction Measurements on Co-Base Amorphous Alloys --
,
The Electrical Recombination Efficiency of Individual Edge Dislocations and Stacking Fault Defects in n-Type Silicon --
,
Flow Stress and Activation Volume of Some Cold-Worked Copper-Based Solid Solutions --
,
A Novel Technique for Preparing Tungsten Field Cathodes with [001] Orientation --
,
Grain Boundary Analysis in TEM (III) --
,
Short Notes --
,
Influence of Structural Defects and Concentration Inhomogeneities in GaAs Epitaxial Layers on Reverse I-U Characteristics of Schottky Barrier Diodes --
,
Silicon Beam Epitaxy for Fabrication of Devices --
,
Entropy and Volume of Solution of Substitutional Impurities in Solids --
,
Helical Density Waves in a Strongly Degenerate Electron-Hole Plasma --
,
Domain Wall Resonance in Zn and Cu Substituted Magnetite --
,
Zur Auswertung der Gleichungen der Lindhard-Scharff-Schiott-Theorie --
,
Debye Temperatures of Silver and Aluminium at High Temperatures. Some New Correlations --
,
The Crystal Structures of HoF3 and TbF3 by Neutron Diffraction --
,
Theimoluminescence of Z1 Centres in NaCl:Ca --
,
The Effect of Real Structure on Optical Properties of ZnTe --
,
Observation of Conductivity Anomalies in Small Needle-Like Crystals of TEA(TCNQ)2 --
,
High Orientation of Coprecipitated Barium Ferrite by Uniaxial Hot- Pressing --
,
Photovoltaic Effect and Photoconductivity in Reduced Potassium Niobate Crystals --
,
Activation theimique de la deformation plastique de l'oxyde cuivreux --
,
Electronic Mobility in Polyethylene Terephthalate --
,
Overlapping between Magnetic and a-y Transition in the FePd System --
,
Critical Damping Condition in IMP ATT Diodes --
,
Pre-Printed Titles --
,
Pre-Printed Titles of papers to be published in the next issues of physica status solidi (a) and physica status solidi (b) --
,
Classsification Scheme — Continued --
,
Backmatter
,
In English.
Additional Edition:
ISBN 9783112500972
Language:
English
DOI:
10.1515/9783112500989
URL:
https://doi.org/10.1515/9783112500989
URL:
https://www.degruyter.com/isbn/9783112500989
URL:
https://doi.org/10.1515/9783112500989
URL:
https://www.degruyter.com/isbn/9783112500989
Bookmarklink