UID:
almahu_9947382215602882
Format:
1 online resource (xii, 305 pages) :
,
illustrations.
ISBN:
3-486-99256-2
Series Statement:
Zeitschrift für Kristallographie / Supplemente ; 27
Content:
Zeitschrift für Kristallographie. Supplement Volume 27 presents the complete Proceedings of all contributions to the V Size Strain Conference in Garmisch-Partenkirchen 2007: Lattice Defects Residual Stresses Texture in Thin Films and at Surfaces Line-Broadening Analysis and Line-Profile Fitting Diffraction/Microstructure Modeling Supplement Series of Zeitschrift für Kristallographie publishes Proceedings and Abstracts of international conferences on the interdisciplinary field of crystallography.
Note:
Bibliographic Level Mode of Issuance: Monograph
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Frontmatter --
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PREFACE --
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Table of Contents --
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PLANAR FAULTING --
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Diffraction analysis of layer disorder /
,
Peculiarities of the X-ray diffraction of oxygen-deficient perovskite-related materials with partial vacancy ordering /
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NANOCRYSTALLINE MATERIALS --
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Interference phenomena in nanocrystalline materials and their application in the microstructure analysis /
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Optimisation of coherent X-ray diffraction imaging at ultrabright synchrotron sources /
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Capacitor discharge sintering of nanocrystalline copper /
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Microstructure study on BN nanocomposites using XRD and HRTEM /
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PLASTIC DEFORMATION --
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Impact of dislocation cell elastic strain variations on line profiles from deformed copper /
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Determination of stored elastic energy in plastically deformed copper /
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Structural studies of submicrocrystalline copper and copper composites by different methods /
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Grain stresses and elastic energy in ferritic steel under uniaxial load /
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Stress and hardness in surface layers of shot-peened steels /
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LINE BROADENING ANALYSIS; DETERMINATION OF CRYSTALLITE SIZE AND MICROSTRAIN --
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The "state of the art" of the diffraction analysis of crystallite size and lattice strain /
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Recent advancements in Whole Powder Pattern Modelling /
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On the simulation of the anisotropic peak broadening in powder diffraction /
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XRD and FTIR characterization of nanocrystalline YVO4: Eu derived by coprecipitation process /
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Cumulants and moments in the line profile analysis /
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X-ray line-broadening analysis of dislocations in a single crystal of Zr /
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XRD line profile analysis of calcite powders produced by high energy milling /
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Refining real structure parameters of disordered layer structures within the Rietveld method /
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Microstructural characterisation of Cr-Al-N nanocomposites deposited by cathodic arc evaporation /
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MATERIALS MICROSTRUCTURE --
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Characterization of hot wall grown N-9-anthracenylidene-1-anthramine films /
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Structural and optical properties of AgInSe2 films /
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In situ synchrotron X-ray diffraction study of formation mechanism of Rh0.33Re0.67 nanoalloy powder upon thermal decomposition of complex precursor /
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Crystallite size and micro- and macrostrain changes during layer exchange upon annealing amorphous/crystalline aluminium /
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Structural state of Eu2(MoO4)3 single crystal after different thermobaric treatments /
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Anomalous structure of nanocrystallites of rare-earth compounds produced by sol-gel methods /
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Refinement of extinction-affected X-ray reflection profile of textures /
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STRESSES AND STRAINS --
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Diffraction analysis of elastic strains in micro- and nanostructures /
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Determination of residual stress at weld interruptions by neutron diffraction /
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Residual stress and elastic anisotropy in the Ti-Al-(Si-)N and Cr-Al-(Si-)N nanocomposites deposited by cathodic arc evaporation /
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In-situ X-ray diffraction investigations of thin films: Determination of thermoelastic constants /
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THIN FILMS --
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Profiling of fibre texture gradients in thin films by anomalous X-ray diffraction /
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X-ray residual stress analysis in CVD multilayer systems: Influence of steep gradients on the line profile shape and - symmetry /
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Magnetron deposited TiO2 thin films - crystallization and temperature dependence of microstructure and phase composition /
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Influence of reactive plasmas on thin nickel films /
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Author Index
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Issued also in print.
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English
Language:
English
DOI:
10.1524/9783486992564
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