UID:
edoccha_9960161390402883
Format:
1 online resource (xxiv, 536 pages)
ISBN:
0-12-811166-6
Series Statement:
Metal oxides series
Note:
Epitaxy of 5d transition metal oxide thin films and heterostructures / J. Nichols, H.N. Lee -- Oxide superlattices by PLD : A practical guide / G. Koster, M. Huijben, G. Rijinders / Oxide molecular beam epitaxy of complex oxide heterointerfaces / F. Baiutti, F. Wrobel, G. Christiani, G. Logvenov -- Electrochemical ionic interfaces / N.H. Perry, G.F. Harrington, H.L. Tuller -- In situ stress measurements of metal oxide thin films / A. Fluri, C. Schneider, D. Pergolesi -- Plume characterization in pulsed laser deposition of metal oxide thin films / S. Amoruso -- Photoemission of buried metal oxide interfaces / M. Sing -- Functional material properties of oxide thin films probed by atomic force microscopy on the nanoscale / N. Balke, A. Tselev -- Controlled atmosphere high-temperature scanning probe microscopy (CAHT-SPM) / K.V. Hansen -- Scanning SQUID measurements of oxide interfaces / Y. Frenkel, B. Kalisky -- First-principle study of metal oxide thin films : Electronic and magnetic properties of confined d electrons / Z. Zhong, Y. Lu -- Computational study of energy materials / A. Chroneos -- High-mobility two-dimensional electron gases at complex oxide interfaces / Y.A. Chen -- Strain and interfaces for metal oxide-based memristive devices / S. Schweiger, J.L.M. Rupp -- Metal oxide thin film-based low-temperature-operating solid oxide fuel cell by interface structure control / J.-W. Son -- Ionic conductivity of metal oxides : An essential property for all-solid-state lithium-ion batteries / C. Chen, R.-A. Eichel, P.H.L. Notten -- Nanoionics and interfaces for energy and information technologies / F. Chiabrera, I. Garbayo, A. Tarancón -- Thermoelectrics based on metal oxide thin films / H. Ohta -- Ferroelectric and piezoelectric oxide nanostructured films for energy harvesting applications / A. Datta, D. Mukherjee, S. Kar-Narayan -- Redox-based memristive metal-oxide devices / C. Bäumer, R. Dittmann.
Language:
English
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