Format:
1 Online-Ressource (ix, 82 pages)
,
illustrations
ISBN:
0769506372
,
9780769506371
Content:
Feasibility of current measurements in sub 0.25-micron VLSIs / A. Keshavarzi, S. Borkar, V. De -- A new scheme for effective I/sub DDQ/ testing in deep submicron / Y. Tsiatouhas ... et al. -- Requirements for practical I/sub DDQ/ testing of deep submicron circuits / D.M.H. Walker -- Defect-based testing for fabless companies / J. Khare, H.T. Heubeken -- Optimal clustering and statistical identification of defective ICs using I/sub DDQ/ testing / A. Rao, A.P. Jayasumana, Y.K. Malaiya -- Impact of technology scaling on bridging fault detections in sequential and combinational CMOS circuits / O. Semenov, M. Schdev -- I/sub DDQ/ profiles / Hugo Cheung, S.K. Gupta -- A practical implementation of BICS for safety-critical applications / P.A. Smith, D.V. Campbell -- Testing of deep-submicron battery-operated circuits using new fast currrent monitoring cheme / M. Margal, I. Pecuh -- IDDQ testable design of static CMOS PLAs / M. Hashizume ... et al. -- On-line testing and diagnosis scheme for intermediate voltage values affecting bus lines / C. Metra, M. Favalli, B. Ricco
Note:
"IEEE order plan catalog number PR00637"--Title page verso
,
"The workshop has been renamed from 'Iddq Testing' to 'DBT'"--Page vii
,
"IEEE Computer Society order number PR00637"--Title page verso
,
Includes bibliographical references and index
Additional Edition:
Print version IEEE International Workshop on Defect Based Testing (2000 : Montréal, Québec) 2000 IEEE International Workshop on Defect Based Testing Los Alamitos, Calif : IEEE Computer Society, ©2000
Language:
English
Keywords:
Konferenzschrift
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