Format:
1 Online-Ressource (74 S.)
,
Ill., graph. Darst.
Note:
Nebentitel: Development of a low temperature measuring device for high resolution x-ray diffraction experiments at 20K using CCD area detection
,
Berlin, Freie Univ., Diss., 2004
Language:
German
Keywords:
Elektronendichtebestimmung
;
Röntgendiffraktometer
;
Tieftemperaturtechnik
;
Hochschulschrift
URL:
Volltext
(lizenzfrei)
Author information:
Messerschmidt, Marc 1976-
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