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  • 1
    Online Resource
    Online Resource
    Scanning Ion Conductance Microscopy (2022)
    Cham : Springer International Publishing | Cham : Springer
    Details
    UID:
    b3kat_BV048496324
    Format: 1 Online-Ressource (XI, 230 p)
    Edition: 1st ed. 2022
    ISBN: 9783031144431
    Series Statement: Bioanalytical Reviews 3
    Additional Edition: Erscheint auch als Druck-Ausgabe ISBN 978-3-031-14442-4
    Additional Edition: Erscheint auch als Druck-Ausgabe ISBN 978-3-031-14444-8
    Additional Edition: Erscheint auch als Druck-Ausgabe ISBN 978-3-031-14445-5
    Language: English
    Subjects: Physics
    RVK:
    UH 6310
    Keywords: Rasterionenleitwertmikroskop ; Rasterkraftmikroskopie
    DOI: 10.1007/978-3-031-14443-1
    URL: Volltext  (URL des Erstveröffentlichers)
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