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  • 1
    UID:
    b3kat_BV002166338
    Format: IX, 311 S. , graph. Darst.
    ISBN: 0824774469
    Series Statement: Industrial engineering. 4.
    Language: English
    Subjects: Mathematics
    RVK:
    Keywords: Zuverlässigkeitstheorie ; Optimierung ; Mathematik ; Zuverlässigkeit ; Technik
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  • 2
    Book
    Book
    Cambridge [u.a.] : Cambridge Univ. Press
    UID:
    b3kat_BV023786379
    Format: XX, 389 S. , graph. Darst.
    ISBN: 0521781272
    Language: English
    Subjects: Engineering
    RVK:
    Keywords: Technische Anlage ; Zuverlässigkeit
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  • 3
    Book
    Book
    Hoboken, New Jersey : Wiley-Scrivener
    UID:
    gbv_1664368620
    Format: pages cm
    ISBN: 9781119509899
    Content: "This book is a critical account of the history, evolution and challenges of higher education in mainland China, Taiwan and Hong Kong, with important reflections on other systems, notably those in the US, UK, Korea and Japan.  In addition to hardware and software, it introduces the concept of “software” in global higher education and analyses its importance for internationalization and the pursuit of excellence.  In an age where robots and artificial intelligence are impacting our jobs and our daily lives, its critical analysis and insightful reflections provide considerable value for a range of global stakeholders interested in higher education reform to nurture talent and promote innovation to prepare students for an unpredictable future.     “Professor Kuo’s perspective provides considerable value for a range of global stakeholders both in the east and the west. As American universities awake to the realization that the demand for higher education is an increasingly global phenomena, his contribution could not be more timely." Mike Crow, PhD President, Arizona State University   “Way Kuo advances a powerful historical argument for the means to achieve excellence in Asian universities. His recipe is bold leadership, combining excellence in teaching and research, and embracing the lessons of western university successes and failures. A superb combination of history and forward thinking." Michael Kotlikoff, VMD, PhD Provost, Cornell University   "Way’s book is not just about the past or the present. Rather, it offers useful insights into the future. In an age where robots and artificial intelligence are impacting our jobs and our daily lives, he introduces the concept of “soulware” and analyzes its importance for higher education." G. P. “Bud” Peterson, PhD President, Georgia Institute of Technology   "Wisdom is the ultimate goal of higher education. It is the illumination of that wisdom among audiences, English-speaking or Chinese-speaking, to which Way Kuo’s book hopes to kindle a spark." Frank H. Shu, PhD President, 2002-06, National Tsing Hua University, Taiwan University Professor, University of California System"--
    Content: "This book is a critical account of the history, evolution and challenges of higher education in mainland China, Taiwan and Hong Kong, with important reflections on other systems, notably those in the US, UK, Korea and Japan. In addition to hardware and software, it introduces the concept of "software" in global higher education and analyses its importance for internationalization and the pursuit of excellence. In an age where robots and artificial intelligence are impacting our jobs and our daily lives, its critical analysis and insightful reflections provide considerable value for a range of global stakeholders interested in higher education reform to nurture talent and promote innovation to prepare students for an unpredictable future. "Professor Kuo's perspective provides considerable value for a range of global stakeholders both in the east and the west. As American universities awake to the realization that the demand for higher education is an increasingly global phenomena, his contribution could not be more timely.""--
    Note: Includes index
    Additional Edition: ISBN 9781119509905
    Additional Edition: Erscheint auch als Online-Ausgabe Kuo, Way, 1951- author Soulware Hoboken, New Jersey : Wiley-Scrivener, 2019
    Language: English
    Keywords: China ; USA ; Universität ; Studium ; Globalisierung ; Interkulturelle Erziehung ; Weiterbildung ; Interkulturelles Lernen ; Interkulturelle Kompetenz
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  • 4
    UID:
    b3kat_BV041999176
    Format: XXIX, 175 S. , graph. Darst.
    ISBN: 9781118773420
    Note: Includes index
    Additional Edition: Erscheint auch als Online-Ausgabe ISBN 978-1-118-77374-1
    Language: English
    Subjects: Engineering
    RVK:
    RVK:
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  • 5
    UID:
    b3kat_BV045188182
    Format: 1 Online-Ressource (XXVI, 394 p)
    ISBN: 9781461556718
    Content: The international market is very competitive for high-tech manufacturers to­ day. Achieving competitive quality and reliability for products requires leader­ ship from the top, good management practices, effective and efficient operation and maintenance systems, and use of appropriate up-to-date engineering de­ sign tools and methods. Furthermore, manufacturing yield and reliability are interrelated. Manufacturing yield depends on the number of defects found dur­ ing both the manufacturing process and the warranty period, which in turn determines the reliability. the production of microelectronics has evolved into Since the early 1970's, one of the world's largest manufacturing industries. As a result, an important agenda is the study of reliability issues in fabricating microelectronic products and consequently the systems that employ these products, particularly, the new generation of microelectronics. Such an agenda should include: • the economic impact of employing the microelectronics fabricated by in­ dustry, • a study of the relationship between reliability and yield, • the progression toward miniaturization and higher reliability, and • the correctness and complexity of new system designs, which include a very significant portion of software
    Additional Edition: Erscheint auch als Druck-Ausgabe ISBN 9780792381075
    Language: English
    Keywords: Elektronisches Bauelement ; Zuverlässigkeit
    URL: Volltext  (URL des Erstveröffentlichers)
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  • 6
    UID:
    b3kat_BV041079372
    Format: XXXII, 440 S. , graph. Darst.
    ISBN: 9781119993445
    Note: "Provides a comprehensive introduction to importance measures in reliability and optimization, allowing readers to address real, large-scale problems within various fields effectivelyThe book is divided into five main parts, the first containing background information on the fundamentals of system reliability. The second part introduces importance measures, including: the Birnbaum importance measure; the Barlow-Proschan importance measure; the Fussell-Vesely importance measure; and the Natvig time-dependent lifetime importance measure. This part also covers structure importance measures, importance measures of pairs of components, and generalizations of importance measures. Part three looks at applications. Importance measures in redundancy allocation and fault diagnosis are discussed, along with importance measures in upgrading systems and in operations research. The fourth part covers comparisons of importance measures and importance measures for con/k/n systems. The final part to the book discusses components assignment problems (CAP), including sections on CAP in coherent systems, CAP in con/k/n/ and its variant systems, and heuristics based on the Birnbaum reliability importance for CAP. A full appendix contains acronyms and notation, errors and ambiguities found in the literature. First book to systematically interpret various importance measures in the field of reliability engineering, to investigate the precise relationships among various importance measures, and to present their applications in the areas of reliability, operations research, and optimization Includes extensive coverage, from the early study of reliability importance to the state-of-the-art in network analysis, multistate systems, and applications in modern systems Contains many case studies, examples, illustrations and tables"-- Provided by publisher. , Includes bibliographical references and index
    Language: English
    Subjects: Engineering
    RVK:
    Keywords: Reliabilität ; Risiko ; Optimierung
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  • 7
    UID:
    gbv_1672410800
    Format: 1 Online-Ressource , Illustrationen
    ISBN: 9781538670767
    Note: "The theme of this year's conference is: Reliability, maintainability, and safety for intelligent manufacturing." - Vorwort , Literaturangaben
    Additional Edition: ISBN 9781538670774
    Language: English
    Keywords: Zuverlässigkeit ; Konferenzschrift
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  • 8
    UID:
    b3kat_BV013150024
    Format: XXVI, 394 S. , graph. Darst.
    ISBN: 0792381076
    Language: English
    Keywords: Elektronisches Bauelement ; Zuverlässigkeit
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  • 9
    UID:
    gbv_347637264
    Format: XVI, 544 S , graph. Darst , 24 cm
    ISBN: 047139761X
    Note: Includes bibliographical references (p. 527 - 538) and index
    Language: English
    Subjects: Engineering
    RVK:
    Keywords: Zuverlässigkeitstheorie
    URL: Cover
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  • 10
    UID:
    gbv_851712231
    Format: 1 Online-Ressource , Illustrationen
    ISBN: 9781479986972 , 1479986984 , 9781479986989
    Note: Literaturangaben , Thema des BMI-Workshops: The human-in-the-loop: BMI, haptics, big data, and shared control , Titelzusatz auf weiterer Titelseite: Proceedings
    Additional Edition: ISBN 9781479986989
    Additional Edition: ISBN 9781479986965
    Language: English
    Keywords: Konferenzschrift
    URL: Volltext  (lizenzpflichtig)
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