UID:
almahu_9949198450102882
Format:
XXII, 564 p.
,
online resource.
Edition:
1st ed. 1986.
ISBN:
9783642827242
Series Statement:
Springer Series in Chemical Physics, 44
Note:
I Retrospective -- II Fundamentals -- III Symposium: Detection of Sputtered Neutrals -- IV Detection Limits and Quantification -- V Instrumentation -- VI Techniques Closely Related to SIMS -- VII Combined Techniques and Surface Studies -- VIII Ion Microscopy and Image Analysis -- IX Depth Profiling and Semiconductor Applications -- X Metallurgical Applications -- XI Biological Applications -- XII Geological Applications -- XIII Symposium: Particle-Induced Emission from Organics -- XIV Organic Applications Including Fast Atom Bombardment Mass Spectrometry -- Index of Contributors.
In:
Springer Nature eBook
Additional Edition:
Printed edition: ISBN 9783642827266
Additional Edition:
Printed edition: ISBN 9783540162636
Additional Edition:
Printed edition: ISBN 9783642827259
Language:
English
DOI:
10.1007/978-3-642-82724-2
URL:
https://doi.org/10.1007/978-3-642-82724-2
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