Online-Ressource
Institute of Electrical and Electronics Engineers (IEEE)
;
1973
In:
IEEE Transactions on Reliability Vol. R-22, No. 3 ( 1973-08), p. 170-176
In:
IEEE Transactions on Reliability, Institute of Electrical and Electronics Engineers (IEEE), Vol. R-22, No. 3 ( 1973-08), p. 170-176
Materialart:
Online-Ressource
ISSN:
0018-9529
DOI:
10.1109/TR.1973.5215933
Sprache:
Unbekannt
Verlag:
Institute of Electrical and Electronics Engineers (IEEE)
Publikationsdatum:
1973
ZDB Id:
2034315-2
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