Format:
Online-Ressource (1 online resource (688 p.))
Edition:
2nd ed (Online-Ausg.)
ISBN:
9781420045550
Series Statement:
EBL-Schweitzer
Content:
Front cover; Contents; Preface to the Second Edition; Editor; Contributors; Chapter 1. Review of ZrO/W Schottky Cathode; Chapter 2. Liquid Metal Ion Sources; Chapter 3. Gas Field Ionization Sources; Chapter 4. Magnetic Lenses for Electron Microscopy; Chapter 5. Electrostatic Lenses; Chapter 6. Aberrations; Chapter 7. Space Charge and Statistical Coulomb Effects; Chapter 8. Resolution; Chapter 9. The Scanning Electron Microscope*; Chapter 10. The Scanning Transmission Electron Microscope; Chapter 11. Focused Ion Beams; Chapter 12. Aberration Correction in Electron Microscopy. - Appendix: Computational Resources for Electron MicroscopyIndex; Back cover. - A guide to understanding, designing, and using high resolution instrumentation such as scanning electron microscope (SEM), scanning transmission electron microscope (STEM), and focused ion beam (FIB) systems. It features chapters on aberration correction and the transmission electron microscope (TEM)
Content:
With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments.The book's unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase fie
Note:
Description based upon print version of record
,
Front cover; Contents; Preface to the Second Edition; Editor; Contributors; Chapter 1. Review of ZrO/W Schottky Cathode; Chapter 2. Liquid Metal Ion Sources; Chapter 3. Gas Field Ionization Sources; Chapter 4. Magnetic Lenses for Electron Microscopy; Chapter 5. Electrostatic Lenses; Chapter 6. Aberrations; Chapter 7. Space Charge and Statistical Coulomb Effects; Chapter 8. Resolution; Chapter 9. The Scanning Electron Microscope*; Chapter 10. The Scanning Transmission Electron Microscope; Chapter 11. Focused Ion Beams; Chapter 12. Aberration Correction in Electron Microscopy
,
Appendix: Computational Resources for Electron MicroscopyIndex; Back cover
Additional Edition:
Buchausg. u.d.T.: Handbook of charged particle optics
Language:
English
Keywords:
Electronic books
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