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Microscopy and microanalysis : the official journal of the Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada (1995)

Oxford : Oxford University Press | New York, NY : Springer | New York, NY : Cambridge University Press ; 1.1995 -

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UID:

gbv_300186495

Format: Online-Ressource

ISSN: 1435-8115

Note: Gesehen am 17.04.24 , Fortsetzung der Druck-Ausgabe

Additional Edition: ISSN 1079-8501

Additional Edition: ISSN 1431-9276

Additional Edition: Erscheint auch als Druck-Ausgabe, bis 2.1996 Microscopy Society of America Journal of the Microscopy Society of America New York, NY : Jones & Begell, 1995 ISSN 1079-8501

Additional Edition: Erscheint auch als Druck-Ausgabe, 1997-2022 Microscopy and microanalysis New York, NY : Cambridge University Press, 1997 ISSN 1431-9276

Language: English

Keywords: Mikroanalyse ; Zeitschrift ; Online-Ressource ; Mikroskopie ; Zeitschrift ; Online-Ressource ; Zeitschrift

URL: https://academic.oup.com/mam

URL: https://www.cambridge.org/core/journals/microscopy-and-microanalysis

URL: Deutschlandweit zugänglich

URL: https://ezb.ur.de/?1481716-0

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Stabi Berlin

UB Potsdam

MPI Bildungsforschung

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Behavior of the ε-Ga2O : Sn evaporation during laser-assisted atom probe tomography (2021)

Chabanais, Florian [VerfasserIn] ; Di Russo, Enrico [VerfasserIn] ; Karg, Alexander [VerfasserIn] ; [et al.]

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UID:

gbv_1843421615

Format: Diagramme

ISSN: 1435-8115

Content: The measurement of the composition of ε-Ga2O3 and the quantification of Sn doping in ε-Ga2O3:Sn by laser-assisted atom probe tomography (APT) may be inaccurate depending on the experimental conditions. Both the role of the laser energy and surface electric field were investigated, and the results clearly indicate that deviations from stoichiometry are observed changing the electric field conditions during APT. The measured atomic fraction of Ga can change from 0.45 at low field to 0.38 at high field, to be compared with the expected 0.4. This was interpreted in terms of preferential evaporation of Ga at high field and deficit of O at low field, which was caused by the formation of neutrals. The quantification of Sn-doping is accurate at low-field conditions, with an overestimation of the detected Sn-metallic fraction at high field. This suggests that Sn has a higher evaporation field compared to Ga. Finally, multiple detection events were in-depth studied, revealing that three dissociation reactions occur during APT: GaO2+ → Ga+ + O+; Ga2O22+ → Ga+ + GaO2+; Ga3O22+ → Ga+ + Ga2O2+. Nevertheless, only 2% of the detected events are related to such dissociation reactions, too small a fraction to fully explain the observed deviation from the stoichiometric composition in ε-Ga2O3.

Note: Gesehen am 24.04.2023

In: Microscopy and microanalysis, Oxford : Oxford University Press, 1995, 27(2021), 4, Seite 687-695, 1435-8115

In: volume:27

In: year:2021

In: number:4

In: pages:687-695

Language: English

DOI: 10.1017/S1431927621000544

URL: lizenzpflichtig

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Cathodoluminescence directly performed in a transmission electron microscope : nanoscale correlation of structural and optical properties (2012)

Christen, Jürgen [VerfasserIn] ; Bertram, Frank [VerfasserIn] 1970- ; Schmidt, Gordon [VerfasserIn] 1985- ; [et al.]

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UID:

gbv_1809405378

ISSN: 1435-8115

In: Microscopy and microanalysis, Oxford : Oxford University Press, 1995, 18(2012), S2, Seite 1834-1835, 1435-8115

In: volume:18

In: year:2012

In: number:S2

In: pages:1834-1835

Language: English

DOI: 10.1017/s1431927612011026

URL: https://doi.org/10.1017/s1431927612011026

Author information: Bertram, Frank 1970-

Author information: Dadgar, Armin

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Microscopic identification of EGFP chimeras within chloroplasts (2003)

Marques, João Pedro [VerfasserIn] ; Hause, Gerd [VerfasserIn] ; Klösgen, Ralf Bernd [VerfasserIn]

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UID:

gbv_1668690527

ISSN: 1435-8115

In: Microscopy and microanalysis, Oxford : Oxford University Press, 1995, 9(2003), S03, Seite 408-409, 1435-8115

In: volume:9

In: year:2003

In: supplement:S03

In: pages:408-409

Language: English

DOI: 10.1017/S1431927603034081

URL: Volltext

Author information: Klösgen, Ralf Bernd

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Multiscale Tomographic Analysis for Micron-Sized Particulate Samples (2020)

Ditscherlein, Ralf [VerfasserIn] 1983- ; Furat, Orkun [VerfasserIn] ; de Langlard, Mathieu [VerfasserIn] ; [et al.]

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UID:

gbv_1751181391

ISSN: 1435-8115

In: Microscopy and microanalysis, Oxford : Oxford University Press, 1995, 26(2020), 4, Seite 1-13, 1435-8115

In: volume:26

In: year:2020

In: number:4

In: pages:1-13

Language: English

DOI: 10.1017/S143192762000173

URL: lizenzpflichtig

Author information: Leißner, Thomas 1984-

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Nanoscale cathodoluminescence of an InGaN single quantum well intersected by individual dislocations (2019)

Schmidt, Gordon [VerfasserIn] ; Veit, Peter [VerfasserIn] ; Metzner, Sebastian [VerfasserIn] ; [et al.]

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UID:

gbv_1685797709

ISSN: 1435-8115

Note: Konferenz: 18th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, DRIP XVIII, Berlin, September, 8-12, 2019

In: Microscopy and microanalysis, Oxford : Oxford University Press, 1995, 22(2019), S3, Seite 602-603, 1435-8115

In: volume:22

In: year:2019

In: supplement:S3

In: pages:602-603

Language: English

DOI: 10.1017/S143192761600386X

URL: https://doi.org/10.1017/S143192761600386X

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Phase-contrast nano-tomographic imaging in a commercial X-ray microscope to understand the defensive behavior of Suocerathrips linguis (2018)

Martins de Souza e Silva, Juliana [VerfasserIn] ; Krüger, Stephanie [VerfasserIn] 1986- ; Radisch, Diana [VerfasserIn] ; [et al.]

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UID:

gbv_1046335030

ISSN: 1435-8115

In: Microscopy and microanalysis, Oxford : Oxford University Press, 1995, Bd. 24 (2018),S 2, Seite 398-399, 1435-8115

In: volume:24

In: year:2018

In: number:2

In: pages:398-399

Language: English

DOI: 10.1017/S1431927618014277

URL: Volltext

Author information: Krüger, Stephanie 1986-

Author information: Wehrspohn, Ralf B. 1970-

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The formation of clusters and nanocrystals in Er-implanted hexagonal silicon carbide (2004)

Kaiser, Ute 1953- ; Muller, David A. ; Chuvilin, Andrey ; [et al.]

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UID:

gbv_826245188

ISSN: 1435-8115

In: Microscopy and microanalysis, Oxford : Oxford University Press, 1995, 10(2004), 2, Seite 301-310, 1435-8115

In: volume:10

In: year:2004

In: number:2

In: pages:301-310

Language: English

URL: Volltext

Author information: Kaiser, Ute 1953-

Author information: Pasold, Gunnar 1974-

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Kooperativer Bibliotheksverbund

Berlin Brandenburg