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Pattern recognition and data mining : third International Conference on Advances in Pattern Recognition, ICAPR 2005, Bath, UK, August 22 - 25, 2005
Berlin [u.a.] : Springer
Details
UID:
b3kat_BV022407763
Series Statement: Lecture notes in computer science ...
Note: Bd. 2 u.d.T.: Pattern recognition and image analyses, 2005
Language: English
Subjects: Computer Science
RVK:
SS 4800
RVK:
ST 330
Keywords: Mustererkennung ; Data Mining ; Konferenzschrift
Author information: Singh, Sameer 1970-
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