Overview
- First monograph on thin-layer and multilayer x-ray analysis
- Up-to-date review
- Critical overview of the literature
Part of the book series: Springer Tracts in Modern Physics (STMP, volume 149)
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Table of contents (12 chapters)
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Front Matter
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Back Matter
Keywords
About this book
thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is a ready-to-hand reference for experimentalists who want to improve their knowledge on modern x-ray methods for thin-film analysis.
Bibliographic Information
Book Title: High-Resolution X-Ray Scattering from Thin Films and Multilayers
Authors: Václav Holý, Ullrich Pietsch, Tilo Baumbach
Series Title: Springer Tracts in Modern Physics
DOI: https://doi.org/10.1007/BFb0109385
Publisher: Springer Berlin, Heidelberg
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eBook Packages: Springer Book Archive
Copyright Information: Springer-Verlag Berlin Heidelberg 1999
eBook ISBN: 978-3-540-49625-0Published: 28 September 2007
Series ISSN: 0081-3869
Series E-ISSN: 1615-0430
Edition Number: 1
Number of Pages: XI, 258
Number of Illustrations: 140 b/w illustrations
Topics: Optics, Lasers, Photonics, Optical Devices, Surfaces and Interfaces, Thin Films, Crystallography and Scattering Methods