Evaluation of Non-Rutherford Alpha Elastic Scattering Cross-sections for Silicon
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A model to simulate large angle Rutherford backscattering spectra in GEANT4
2022, Computer Physics CommunicationsCitation Excerpt :Figs. 4 and 5 show that the simulated cross sections are in good agreement with the SigmaCalc ones and thus our model correctly calculates cross section. However, the experimental cross sections often show deviations from the theoretical ones [34], [35], and deviations in RBS spectra are also expected. The benchmarking (made in SigmaCalc website) of the cross sections calculated by SigmaCalc against experimental spectra shows that in the higher energy regions significant deviations occur.
On the accuracy of Total-IBA
2020, Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and AtomsCitation Excerpt :The SigmaCalc [36] (v.2.0 [37]) code is publicly available, and can generate cross-section functions for any given scattering angle. Some of the important reactions have been published separately: these include the C [38,39], O [40], Mg [41], Al [42], and Si[43] reactions (for proton scattering, see Table 2); and the C [44], O [22], and Si[45] reactions (for alpha scattering). Where evaluated data are not available, measured data are taken from the collection in IBANDL [46,47].
Differential cross-section measurements for deuteron elastic scattering on <sup>nat</sup>Si for elastic backscattering purposes
2019, Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and AtomsCitation Excerpt :Thus, emerges a great need for the application of Ion Beam Analysis (IBA) techniques in order to acquire an accurate quantitative determination of silicon depth profile concentrations. Among all IBA techniques, Elastic Backscattering Spectroscopy (EBS) with protons [1] and alpha particles [2] is the most widely used for silicon depth profiling studies due to the existence of evaluated data in IBANDL (Ion Beam Analysis Nuclear Data Library, https://www-nds.iaea.org/exfor/ibandl.htm), via the online calculator SigmaCalc 2.0 (http://sigmacalc.iate.obninsk.ru/). However, an alternative, prominent IBA technique, especially in the case of thin or semi-thick films containing silicon in complicated matrices (e.g. silicides), is Nuclear Reaction Analysis (NRA), via the simultaneous implementation of the 28Si(d,p0,1)29Si reactions [3], for which recommended differential cross-section datasets at 150° already exist in IBANDL.
SigmaCalc recent development and present status of the evaluated cross-sections for IBA
2016, Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and AtomsCitation Excerpt :The detailed consideration of the problems inherent in the benchmark experiment can be found elsewhere [7]. The importance of benchmarking has been recognized by the IBA community and nowadays the works in which this concept is employed are not rare in the literature (see e.g. [8–10]). Benchmarking is an important step in the evaluation methodology which provides an evaluator with a feedback for the next iteration of the cross-section evaluation.
Experimental Study of Thick Target Yield from the <sup>13</sup>C(α,n<inf>0</inf>)<sup>16</sup>O Reaction
2023, Nuclear Science and EngineeringQuantifying nitrogen in GeSbTe:N alloys
2020, Journal of Analytical Atomic Spectrometry
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On leave from Institute for Physics and Power Engineering, Obninsk 249033, Russia