UID:
almahu_9948026011202882
Format:
1 online resource (277 p.)
ISBN:
1-281-03662-5
,
9786611036621
,
0-08-050691-7
Content:
Fourier Transform Spectrometry is of immediate use to those who use Fourier transform spectrometers in their research, or are considering their use. The authors' presentations enable readers to obtain a clear understanding of FTS, which is crucial to their studies and research.Due to the increasing complexity and commercialization of instrumentation, achieving optimum performance in research applications and automated usage can be challenging. For example, a thorough understanding of the instrument can dramatically affect the outcome of the experiment and the generation of relia
Note:
Description based upon print version of record.
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Front Cover; Fourier Transform Spectrometry; Copyright Page; Table of Contents; Preface; Chapter 1. Introduction; 1.1 Spectra and Spectroscopic Measurement; 1.2 The Classical Michelson Interferometer; 1.3 Precision, Accuracy, and Dynamic Range; 1.4 Units; 1.5 A Glance Ahead and to the Side; Chapter 2. Why Choose a Fourier Transform Spectrometer?; 2.1 Quantity; 2.2 Quality; 2.3 Cost; 2.4 Summary; Chapter 3. Theory of the Ideal Instrument; 3.1 Equation for the Balanced Output; 3.2 The Unbalanced Output; 3.3 From Monochromatic to Broadband Light
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3.4 The Fourier Transform Spectrometer as a Modulator3.5 Summary; Chapter 4. Fourier Analysis; 4.1 Linear Systems and Superposition; 4.2 A Practical Approach to Fourier's Theorem; 4.3 Fourier Decomposition; 4.4 Representations of Functions and Their Transforms; 4.5 Practical Representations; 4.6 Linear Systems and Convolution; 4.7 Generalized Functions; 4.8 The Essential Theorems; 4.9 Examples of Transform Pairs Fundamental to FTS; Chapter 5. Nonideal (Real-World) Interferograms; 5.1 Finite Path Difference; 5.2 Finite Entrance Aperture Size; 5.3 Finite Instrumental Function and its Properties
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5.4 Non-uniform or Non-symmetric Irradiation of the ApertureChapter 6. Working with Digital Spectra and Fourier Transforms; 6.1 Signals and Measurement; 6.2 Discrete Transforms; 6.3 Interpolation in the Spectrum; 6.4 Apodization; 6.5 Preparation for Making Transforms; 6.6 Procedure for Reliable Transforms; Chapter 7. Phase Corrections and Their Significance; 7.1 The What and Why of Phase; 7.2 Origins of Asymmetries in the Interferogram; 7.3 From Asymmetries to Phase Errors; 7.4 Asymmetric Truncation, Amertization, and Phase Errors; 7.5 More on One-Sided vs. Symmetric Interferograms
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7.6 Determining Phase Shifts7.7 Recommendations; Chapter 8. Effects of Noise in Its Various Forms; 8.1 Signal and Noise in the Two Domains; 8.2 Noise Classifications; 8.3 Unbalance, Misalignment, Modulation Efficiency, and Signal-to-Noise; 8.4 Noise Limited Resolution; 8.5 Localized Noise (Ghosts and Artifacts); 8.6 Summary; Chapter 9. Line Positions, Line Profiles, and Fitting; 9.1 Introduction; 9.2 Line Finding and Line Shapes; 9.3 Derivative Line Finding; 9.4 Least Square Fitting of Line Profiles to Voigtian Functions; 9.5 Areas and Equivalent Widths; 9.6 Wavenumber Calibration
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Chapter 10. Processing of Spectral Data10.1 Emission Background Subtraction and Intensity Correction; 10.2 Absorption Background and Intensity Corrections; 10.3 Line Lists and Fitting; Chapter 11. Discussions, Interventions, Digressions, and Obscurations; 11.1 A Novel Approach to Sampling Systems; 11.2 The Imaging Fourier Transform Spectrometer (IFTS); 11.3 Characterization and Determination of Instrumental Line Shape Functions; 11.4 Apodization; 11.5 The Quest for the Perfect Instrument; 11.6 On Fourier Transform Spectrometry and Digital Signal Processing
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11.7 From Echelle Spectrographs to Echelle Spectrographs - A 50-Year Circle
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English
Additional Edition:
ISBN 0-12-042510-6
Language:
English
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