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  • 1
    UID:
    b3kat_BV002323192
    Umfang: XVI, 480 S. , graph. Darst.
    ISBN: 0306375125
    In: 2
    Sprache: Englisch
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 2
    Buch
    Buch
    New York, NY [u.a.] : Plenum Press
    UID:
    gbv_124898556
    Umfang: XVI, 480 S. , Ill., graph. Darst.
    ISBN: 0306375125
    Serie: Point defects in solids / ed. by James H. Crawford and Lawrence M. Slifkin; Vol. 2
    Anmerkung: Literaturangaben
    Sprache: Englisch
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 3
    UID:
    almafu_BV002323192
    Umfang: XVI, 480 S. : graph. Darst.
    ISBN: 0-306-37512-5
    In: Point defects in solids.
    Sprache: Englisch
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 4
    UID:
    almahu_9949199332502882
    Umfang: XVI, 480 p. 25 illus. , online resource.
    Ausgabe: 1st ed. 1975.
    ISBN: 9781468409048
    Inhalt: Volume 1 of Point Defects in Solids has as its major emphasis defects in ionic solids. Volume 2 now extends this emphasis to semiconductors. The first four chapters treat in some detail the creation, kinetic behavior, inter­ actions, and physical properties of both simple and composite defects in a variety of semiconducting systems. Also included, as in Vol. 1, are chapters on special topics, namely phonon-defect interactions and defects in organic crystals. Defect behavior in semiconductors has been a subject of considerable interest since the discovery some twenty-five years ago that fast neutron irradiation profoundly affected the electrical characteristics of germanium and silicon. Present-day interest has been stimulated by such semiconductor applications as solar cell power plants for space stations and satellites and semiconductor particle and y-ray detectors, since in both radiation damage can cause serious deterioration. Of even greater practical concern is the need to understand particle damage in order to capitalize upon the develop­ ing technique of ion implantation as a means of device fabrication. Although the periodic international conferences on radiation effects in semiconductors have served the valuable function of summarizing the extensive work being done in this field, these proceedings are much too detailed and lack the background discussion needed to make them useful to the novice.
    Anmerkung: 1. Defect Creation in Semiconductors -- 1. Introduction -- 2. Defect Properties -- 3. Damage Phenomenology -- 4. Interactions of Particles with Semiconductors -- 5. Survey of Displacement Damage Results -- 6. Subthreshold and Ionization Damage -- 7. Theories of Displacement Damage Production -- 8. Summary -- References -- 2. Diffusion in Semiconductors -- 1. Introduction -- 2. Atomic Theory of Diffusion -- 3. Continuum Theory of Diffusion -- 4. Diffusion in Ge and Si -- 5. Diffusion in the III-V Compounds -- 6. Diffusion in the II-VI Compounds -- 7. Summary and Conclusions -- References -- 3. Effects of Point Defects on Electrical and Optical Properties of Semiconductors -- 1. Introduction -- 2. Carrier Concentration -- 3. Carrier Mobility -- 4. Minority Carrier Lifetime -- 5. Optical Absorption -- 6. Photoconductivity -- 7. Luminescence -- 8. Conclusion -- References -- 4. Electron Paramagnetic Resonance of Point Defects in Solids, with Emphasis on Semiconductors -- 1. Introduction -- 2. Basic Concepts -- 3. Theory of EPR for Defects in Solids -- 4. Additional Examples -- 5. Auxiliary Techniques -- References -- 5. Phonon-Defect Interaction -- 1. Introduction -- 2. Theoretical Background -- 3. External Interactions -- 4. Internal Interactions -- 5. Summary and Conclusion -- References -- 6. Point Defects in Molecular Solids -- 1. Introduction -- 2. Self-Diffusion -- 3. Experimental Determination of the Formation and Migration Parameters for Point Defects.
    In: Springer Nature eBook
    Weitere Ausg.: Printed edition: ISBN 9781468409062
    Weitere Ausg.: Printed edition: ISBN 9780306375125
    Weitere Ausg.: Printed edition: ISBN 9781468409055
    Sprache: Englisch
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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